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86100D Infiniium DCA-X Wide-Bandwidth Oscilloscope Mainframe

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US$ 25,348 Typical Price*


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Supporting Documents

Explore how this product addresses specific measurement challenges.

Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, and 2-Port TDR - Application Note
This Application Note focuses on part 1: those which use a single-port TDR, those which use TDR/TDT, and those which use 2-port TDR.
Digital Communication Analyzer (DCA), Measure Relative Intensity Noise (RIN) - Application Note
Digital Communication Analyzer (DCA), Measure Relative Intensity Noise (RIN).
Time Domain Reflectometry Theory - Application Note
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.
Equalization: The Correction and Analysis of Degraded Signals - Application Note
This whitepaper introduces engineers to the concepts of equalization and terms used in the development of emerging technologies that use standard materials (e.g., FR4) for buses and backplanes at ever higher rates.
Comparison of Different Jitter Analysis Techniques With a Precision Transmitter - Application Note
This white paper describes how various jitter analysis techniques give dissimilar results. Which is right? We built a precision jitter transmitter to compare results of different techniques where test sets were exposed to known levels of jitter.
Precision Jitter Analysis Using the Keysight 86100C DCA-J - Application Note
This product note provides a guide to making jitter measurements with the Keysight 86100C DCA-J.
Precision Waveform Analysis for High-Speed Digital Communications - Application Note
This document will discuss the Keysight 86108A precision waveform analyzer plug-in module with the Keysight 86100C DCA-J sampling oscilloscope mainframe for accurate analysis of high-speed digital communications signals.
Techniques for Higher Accuracy Optical Measurements - Application Note
Learn techniques for high accuracy optical measurements using System Impulse Response Correction
Techniques to Reduce Manufacturing Cost-of-Test of Optical Transmitters, Flex DCA Interface
Keysight continues innovating test methodologies to assist manufacturing engineers in meeting or beating cost-of-test reduction goals.
Techniques to Reduce Manufacturing Cost-of-Test of Optical Transmitters - Application Note
Pressures to reduce costs as data rates rise means manufacturing engineering managers and their engineers must be more creative in how to reduce costs before their competitors do.
SATA II Drive TX/RX Testing & Cable SI Testing Using the 86100C DCA-J - Technical Overview
SATA II Drive Tx/Rx Testing & Cable SI Test using 86100C DCA-J. Product Note 86100-8
High Precision Time Domain Reflectometry - Application Note
Time domain reflectometry (TDR) is a well-established technique for verifying the impedance and quality of signal pats in components, interconnects, and transmission lines.
Advanced Jitter Generation and Analysis Product Note - Application Note
This product note shows how the Keysight pulse generators can be used with the DCA-J Oscilloscope.
What is the difference between an equivalent time and a real-time oscilloscope? - Application Note
This document will discuss how each type of oscilloscope samples the incoming waveform and explain the trigger requirements.
Jitter Measurements on Long Patterns Using 86100DU-401 Advanced Waveform Analysis - Application Note
To overcome pattern length limitations found in many of today’s jitter analysis tools, Keysight developed a Microsoft Office Excel-based application called 86100DU Option 401 Advanced Waveform Analysis
Total Jitter Measurements at Low Probability Levels, Using Optimized BERT Scan Method
This paper describes an optimized technique based on probabliity and statistics theory that enables accurate TJ measurements at the 1e-12 bit error ratio level in about 20 minutes at 10 Gbit/s.
Improving Optical Transceiver Extinction Ratio Measurement Accuracy
This paper discusses how to improve optical transceiver extinction ratio measurement accuracy by using reference receiver correction factors.
Jitter Analysis: The Dual-Dirac Model, RJ/DJ, and Q-Scale - Application Note
This paper provides a complete description of the dual-Dirac model, how it is used in technology standards and a summary of how it is applied on different types of test equipment.

* Prices for: Hong Kong. Prices are subject to change without notice. Prices shown are Manufacturer's Suggested Retail Prices (MSRP).