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NX5730A High Throughput 1 ns Pulsed IV Memory Test Solution NEW!

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Key Features and Functions
  • Precise and fast characterization of new memory, such as spin transfer torque magnetoresistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers
  • Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ
  • Perform all typical MTJ characterization tests in one solution
  • 10 to 100 times faster cycle test, such as a bit error rate test (BERT)
  • Capture and visualize MTJ switching waveforms clearly during the writing pulse
  • Dedicated solution with Keysight Technologies’ technical expertise

Software for this Product

Frequently Bought Together

 Precision Current-Voltage Analyzers
Precision Current-Voltage Analyzers
  • Integrated SMUs and characterization software makes IV characterization much quicker and simpler
  • EasyEXPERT group+ software supports all the characterization tasks
  • A wide selection of analyzers suitable to your specific measurement needs

* Prices for: United Kingdom. Prices are subject to change without notice. For pricing or a quote, you can also call 0800 0260637.