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E5260A 8-Slot High Speed Measurement Mainframe

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Prices for: Singapore

* Prices are subject to change without notice. Prices shown are Manufacturer's Suggested Retail Prices (MSRP).

Key Features & Specifications

General features

  • Perform high-speed, dc parametric measurements
  • Eight slots for plug-in modules
  • Code compatible with 4142B
  • Basic and simple IV measurement via Desktop EasyEXPERT

Measurement capabilities

  • +/- 200 Volt and +/- 1 Amp output capability (HPSMU)
  • +/- 100 Volt and +/- 200 milliamp output capability (MPSMU)
  • 4 Amp ground unit

Description

The Keysight E5260A lowers your cost-of-test by providing a high-speed parametric test solution for semiconductor, RFIC, and optical component testing. Key features include a modular configuration with eight slots available for plug-in modules, high-speed DC measurement of current and voltage, enhanced measurement speed for fast throughput, expanded program memory, 16 digital I/O lines for sophisticated triggering requirements, and parallel test capability.

Basic and simple IV measurement can be made with the version 4.0 or later of Desktop EasyEXPERT. Available functions are limited. The latest Desktop EasyEXPERT is downloadable from "Related Product" under "Option & Accessories" with free of charge.

Industry Challenges

Engineers and scientists working on current and future semiconductor devices, monolithic microwave integrated circuits (MMICs), RFICs, and optical components require fast, flexible and robust instrument-based testing solutions to lower the cost-of-test.  Testing requirements can be a moving target, which often frustrates efforts to predict testing needs in the future.  The ideal answer is a reasonably priced yet modular and expandable solution that provides the testing resources needed today, and that has the flexibility to ensure that it does not become obsolete. Alternatives on the market consist of single SMUs, which present many challenges with respect to synchronization and achieving fast trigger response. Available alternatives also cannot always supply sufficient current to meet the testing needs of modern devices.

Summary

Fast measurement that lowers cost-of-test

The fast measurement speed and modular nature of the E5260A makes it an ideal choice for high-speed production test. For technologically advanced devices of today and tomorrow, the Keysight E5260A lowers your cost-of-test with a high-speed parametric test solution for semiconductor, RFIC, and optical component testing. Based on well-proven Keysight 4070 Series system technology, the E5260A provides superior measurement throughput that is several times faster than earlier products such as the Keysight 4142B. The instrument is modular, which enables customization now and provides for future expansion as requirements change. A number of innovative design elements help to improve the efficiency of complex testing, such as expanded program memory to accelerate the measurement process, and 16 digital I/O lines for sophisticated triggering requirements. Moreover, historically encountered power limitations on the instrument mainframe (such as often occur with the 4142B) have been eliminated.

  • Modular design enables customization now and provides for future expansion
    The flexible, modular configuration has eight slots available for plug-in modules. Currently available source/monitor unit (SMU) types are a medium power SMU (MPSMU) -- requiring one slot -- and a high-power SMU (HPSMU) -- requiring two slots. Easily expand into the E5260A from your current environment because commands developed on the 4142B can also run on the new system.
  • High measurement speed
    The E5260A performs DC measurements of current and voltage through measurement speeds of SMUs that are 2-3 times faster than that of the Keysight 4142B.
  • Innovative design elements support complex testing and improve efficiency
    Program memory has been greatly enhanced, with storage capacity for up to 40,000 command lines, which accelerates the measurement process. A fast and flexible advanced triggering scheme, based upon 16 digital I/O lines, in addition to the BNC trigger-in & trigger-out connectors, is ideal for sophisticated triggering requirements. Also, trigger signals are routed through hardware rather than firmware, resulting in the fastest instrument response possible. To enable parallel testing, each SMU is equipped with its own analog-to-digital converter (ADC) therefore no bottlenecks. Engineers can perform and report spot measurements easily via a simple front-panel interface, without programming. In addition, you can use the same user interface to view other items of interest, such as error messages when debugging the instrument performance under automated control.
  • Designed to withstand heavyweight power demands
    Alternative testing solutions may present power limitations, but not the E5260A. No matter which type or how many modules are installed into the E5260A mainframe, all installed modules can output maximum voltage or current at the same time. For example, if 4 HPSMUs are installed in the E5260A, then each HPSMU can output 1 Amp. A 4.0 Amp ground unit is resident in the instrument mainframe to ensure that you can sink the current output of these 4 HPSMUs without having to worry about resistive ground rise issues. In addition, each MPSMU can source and sink up to 200 mA each, which is twice the capability typically found in a MPSMU.

Features and Benefits

Feature Benefit
Eight module slots Flexibility now and expandability in the future
SMUs that measure several times faster than 4142B SMUs Faster test times and improved throughput, resulting in a lower cost-of-test
Code compatible with the 4142B Replace current 4142Bs with the E5260A and enjoy a large throughput improvement with only minimal test code modification
16 digital I/O lines for instrument triggering in addition to BNC trigger-in & trigger-out connectors Sophisticated triggering schemes involving multiple instruments can easily be created
All trigger signals are processed via hardware rather than firmware Fastest possible trigger response from the instrument
Front panel control Can conveniently perform and report spot measurements via a simple front-panel interface, without programming.  View other items of interest, such as error messages, valuable when debugging the instrument performance under automated control.
When 4 HPSMUs are installed then each HPSMU can output 1 A No power restrictions; no need to think about mainframe power restrictions when developing applications
4.0 Amp Ground unit (GNDU) Sink the current output of 4 HPSMUs without worrying about resistive ground rise issues

Components

  • E5260A High Speed Measurement Mainframe
  • E5290A High Power Source/Monitor Unit module (HPSMU)
  • E5291A Medium Power Source/Monitor Unit module (MPSMU)
  • Cables and accessories
  • Manual CD-ROM
  • Software CD-ROM (including VXIplug&play driver)