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特点

Keysight Mini ICT 具有以下功能特性，可以与其他仪器结合使用提供出色的 ICT 测试能力：

  • 5U 19 英寸机架安装外形
  • 完整的模拟 ICT 测试功能，包括 VTEP v2.0
  • 完整的数字 ICT 测试功能，包括 IEEE1149 边界扫描和覆盖扩展技术
  • 真正的 1:1 逐引脚可编程体系结构，具有 500 mA 驱动能力
  • 内置被测器件电源控制功能和完整的放电功能
  • SCPI 支持基于 VISA 的测试序列发生器
  • 独立和并行在线测试

通过将功能测试与在线测试相结合，最大限度扩展您的测试覆盖范围！

Keysight Mini ICT 是机架中真正的在线测试单元，可以单独使用，也可以整合使用。 它具有全套 Keysight ICT 测试功能特性：从 VTEP 非矢量测试、覆盖扩展技术到数字程序库测试和边界扫描。 这种非混合逐引脚可编程数字引擎使测试开发变得非常灵活和轻松，尤其是当功能测试需要对器件进行调理的情况下更是明显。

标准仪器 SCPI 命令使其可以轻松与其他仪器和 IVI VISA 体系结构下的外部测试序列发生器协同工作。 内置的程序脚本工具让整个测试执行过程更加灵活，切实满足您的需求。

主要技术指标

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Fixture Actuation
Press down
最大节点数
512
Max Parallel Testing
1
System Type
Benchtop
System Width
630 mm
Fixture Actuation
最大节点数
Max Parallel Testing
System Type
System Width
Press down
512
1
Benchtop
630 mm
查看更多
Fixture Actuation:
Press down
最大节点数:
512
Max Parallel Testing:
1
System Type:
Benchtop
System Width:
630 mm

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扩展小型在线测试系统的功能

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关于 U9403A 小型在线测试系统的特色资源

应用指南 2016.03.02

Mini In-Circuit Tester

Mini In-Circuit Tester

This application note discusses the SCPI commands and the potential use models with the modular Keysight Mini In-Circuit Tester.

2016.03.02

Application Notes 2018.03.07

Integrating Keysight x1149 and Mini ICT for Better ICT Test Coverage

Integrating Keysight x1149 and Mini ICT for Better ICT Test Coverage

Improve test coverage with the integration of the x1149 and Mini ICT into a single test station and extend the usage and flexibility of both platforms.

2018.03.07

Application Notes 2019.05.09

What is MGND

What is MGND

The i1000 misreporting of failed card. Digital card is damaged but Analog card is reported as damaged instead.

2019.05.09

Application Notes 2019.05.08

Simplify Boundary Scan Test Development and Debug

Simplify Boundary Scan Test Development and Debug

Keysight’s i1000D In-Circuit Test System provides 4 tools to simplify boundary scan test development and debug. Learn more!

2019.05.08

Data Sheets 2018.08.25

Medalist i1000D In-Circuit Test System Family

Medalist i1000D In-Circuit Test System Family

Keysight Medalist i1000D redefines digital test to provide electronics manufacturers with user-friendly and affordable testing for digital devices. The Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards with a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless.

2018.08.25

Application Notes 2019.05.10

Boundary Scan Test Development on i1000D In-Circuit Test System

Boundary Scan Test Development on i1000D In-Circuit Test System

Reduce your boundary scan engineering efforts by using Keysight’s i1000D In-Circuit Test System. Follow this implementation guide to meet the requirements.

2019.05.10

Case Studies 2017.07.24

Mini ICT with VTEP Detects Solder Failure on PCBA Board

Mini ICT with VTEP Detects Solder Failure on PCBA Board

Find out how one customer reported reduction in bone pile and significant savings on scrap cost after using the Mini ICT systems with VTEP.

2017.07.24

技术资料 2016.03.07

Mini In-Circuit Tester

Mini In-Circuit Tester

Keysight Mini In-Circuit Tester is a modular in-circuit test unit fitting a typical 19-inch rack to flexibly complement existing tests in your manufacturing line to increase defects test coverage.

2016.03.07

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