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Y9080B LTE FDD Measurement and Waveform Application for EXM

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Prices for: United States

* Prices are subject to change without notice. Prices shown are Manufacturer's Suggested Retail Prices (MSRP). Prices shown are exclusive of taxes.

Key Features & Specifications

Features

  • Supports measurements per 3GPP Release 9 standard
  • Unlimited waveform playback capability for Signal Studio developed LTE FDD waveforms
  • One-button, standards-based measurements with pass/fail tests
  • Superior measurement speed for wireless device manufacturing with multiple measurements from a single acquisition using the EXM uplink sequencer

Measurements

  • EXM for user equipment (UE) test: EVM, frequency error, I/Q offset, spectrum flatness, in-band emissions, transmit on/off power, channel power, occupied BW, ACP, and SEM
  • Multiple color-coded result views: EVM vs. subcarrier, EVM vs. symbol, EVM vs. slot, EVM, vs. resources block (RB), detected allocations (subcarrier vs. symbol), error summary table, frame summary table, and more

Access features

  • License key upgradeable
  • Fixed and transportable licenses available
  • SCPI remote user interface

Description

The LTE FDD measurement and waveform application helps you easily achieve your manufacturing test goals for today’s multi-format devices. It quickly performs standards-based measurements for compliance with 3GPP Release 9. The EXM’s flexible sequencer uses single acquisition multiple measurement (SAMM) techniques to provide high-speed calibration and verification of your devices and modules for maximum manufacturing throughput. Should issues arise, multiple color-coded result views help you quickly identify them for quick resolution. Using the LTE FDD measurement application with the EXM makes it easy to rapidly ramp up and optimize full-volume manufacturing.

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