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Key Features & Specifications

Signal analysis

  • LTE and LTE-Advanced TDD per 3GPP release 8 to 12
  • Uplink and downlink RF transmitter conformance measurements in a single option
  • Carrier aggregation (CA) with up to five component carriers (CCs) in both contiguous and non-contiguous configuration
  • Improved spectral efficiency with higher order demodulation to 256QAM
  • Runs inside PXA, MXA, and EXA signal analyzers with Windows 7 operating system and VXT PXIe vector transceivers

Measurements

  • Output power level: channel power, transmit On/Off power
  • Transmitted signal quality: EVM, frequency error, time alignment error, RSTP, OSTP, I/Q offset, spectral flatness, and more. Pinpoint signal impairments with color-coded traces like EVM vs. symbol, EVM vs. subcarrier, detected allocations (subcarrier vs. symbol), constellation diagram, and frame summary
  • Unwanted emissions: SEM, cumulative SEM, ACLR, cumulative ACLR (CACLR), OBW, spurious emissions, transmitter intermodulation
  • All measurements are available for single carrier (LTE) and multi-carrier/CA (LTE-Advanced) with contiguous or non-contiguous allocations as defined by 3GPP

Performance (hardware dependent, single carrier)

  • Residual EVM, 5 MHz downlink signal: up to 0.34% (0.28% nominal)
  • ACLR, 5 MHz E-UTRA adjacent channel: up to -83.5 dB (nominal)
  • Absolute power accuracy: up to ±0.19 dB
  • Analysis bandwidth: PXA, MXA, VXT up to 160 MHz; EXA up to 40 MHz

Other features

  • Windows 7 operating system is required in order to use this application - more details
  • License key upgradeable
  • Fixed and transportable license available
  • SCPI remote user interface

Description

The LTE/LTE-Advanced TDD measurement application is one in a common library of more than 25 measurement applications in the Keysight X-Series, an evolutionary approach to signal analysis that spans instrumentation, measurements and software. Transforming the X-Series signal analyzers into standard-based transmitter testers, the application provides RF conformance measurements to help you design, evaluate, and manufacture your LTE and LTE-Advanced TDD base station and user equipment devices. The measurement application closely follows the 3GPP standard allowing you to stay on the leading edge of your design and manufacturing challenges.

For LTE-Advanced demodulation measurements, such as EVM and frequency error, the measurement application offers two modes for acquisition of up to 5 carriers. The first mode offers simultaneous acquisition of up to 5 intra band contiguous/ non-contiguous component carriers with a single wideband capture (requires PXA/MXA with 160 MHz bandwidth), or the second mode which uses an automatic sequencing function, eliminating the need for the wide analysis bandwidth option on the X-Series signal analyzer thereby reducing the overall test equipment cost.

RF transmitter testing

  • Simplify measurement setup with automatic detection of downlink channels and signals. For eNB conformance testing, measurement is simplified by recalling E-TM presets, for each carrier, according to 3GPP TS 36.141 conformance document.
  • Perform measurement on all LTE/LTE-Advanced channel bandwidths with ability to view measured results – of up to 5 CCs for LTE-Advanced- in multiple domains such as resource block, sub-carrier, slot, or symbol. Graphical displays with color coding and marker coupling allows you to search for problems faster and troubleshoot the found problems quicker.
  • Test beyond physical layer by using the transport layer decoding functionality. Troubleshoot transport layer problems and verify the channel encoding is correct by getting access to data at different points in the receiver chain such as: demapped, deinterleaved, descrambled, deratematched and decoded data.
  • Add real-time spectrum analyzer (RTSA) capability to the PXA or MXA signal analyzers to pinpoint interference caused by other transmitters in the operating band or other events such as cross-modulation of component carriers in the transmitter.

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