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Get app notes for digital multilevel signalizing techniques and high-speed coherent optical -AppNote
Get app notes for digital multilevel signalizing techniques and high-speed coherent optical

Notes d’application 2014-09-22

Solutions for LTE-Advanced Manufacturing Test - Application Note
This “Solutions for LTE-Advanced Manufacturing Test” application note gives insight into how to better understand the requirements for LTE-Advanced Carrier Aggregation manufacturing test.

Notes d’application 2014-08-04

GaAs MMIC TWA Users Guide - Application Note
GaAs MMIC TWA Users Guide. This application note gives a technical overview of the TC700, TC702 and TC900 GaAs MMIC Traveling Wave Amplifiers (TWA).

Notes d’application 2014-08-04

PDF PDF 1.59 MB
Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity - Application Note
Make the most accurate digital measurements by learning how to evaluate oscilloscope sample rates vs. signal fidelity.

Notes d’application 2014-08-04

TC611 GaAs Detector Diode Sensitivity Measurements - Application Note
This publication presents detector voltage measurements, compared to the deviation from linearity (referenced to -40 dBm).

Notes d’application 2014-08-03

PDF PDF 324 KB
FET Switch Speed and Settling Time - Application Note
This publication describes the occurrence and some of the possible solutions for “slowtails” FET switch behavior.

Notes d’application 2014-08-03

PDF PDF 860 KB
USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the solution for the USB 2.0 test suite. The Keysight solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

Notes d’application 2014-08-03

Modifying DDR Libraries for Silicon Nail Test Generation on the Keysight x1149 Boundary Scan Analyzer
This application note describes how to modify DDR libraries to generate silicon nails tests on the Keysight x1149 Boundary Scan Analyzer.

Notes d’application 2014-08-03

PDF PDF 1.57 MB
Releasing the “Test Sequence” and “Test” to Production on the Keysight x1149 Boundary Scan Analyzer
This application note describes how to release test sequences and tests to production when using the Keysight x1149 Boundary Scan Analyzer.

Notes d’application 2014-08-03

PDF PDF 5.52 MB
Using Microwave Switches When Testing High Speed Serial Digital Interfaces
Many high speed digital interfaces use multiple lanes to achieve their system's throughput requirements. Most issues associated with this can be resolved with a switching network.

Notes d’application 2014-08-03

GaAs MMIC ESD, Die Attach, and Bonding Guidelines - Technical Overview
This application note contains information on die attach methods and bonding methods for integrated circuits.

Notes d’application 2014-08-03

PDF PDF 327 KB
Beam Lead Diode Bonding and Handling Procedures - Application Note
This application note explains how to handle diodes to reduce the risk of damage by static electricity or damage during testing and assembly.

Notes d’application 2014-08-03

PDF PDF 108 KB
Tips and Techniques for Accurate Characterization of 28 Gb/s Designs - Application Note
The worldwide demand for data capacity in networks greatly increases every year, driven by services like cloud computing and Video on Demand.

Notes d’application 2014-08-02

SATA II Drive TX/RX Testing & Cable SI Testing Using the 86100C DCA-J - Technical Overview
SATA II Drive Tx/Rx Testing & Cable SI Test using 86100C DCA-J. Product Note 86100-8

Notes d’application 2014-08-02

PDF PDF 1.94 MB
Achieve Accurate Resistance Measurements with the Keysight 34980A Multifunction Switch Measure Unit
This application note provides an overview of how to make an accurate 2-wire, 3-wire and 4-wire resistance measurements with the Keysight 34980A

Notes d’application 2014-08-02

Bandwidth and Rise Time Requirements for Making Accurate Oscilloscope Measurements
How much oscilloscope bandwidth do you need and how fast does the rise time need to be to measure your signals accurately?

Notes d’application 2014-08-02

PDF PDF 724 KB
Imaging Graphene via Low Voltage Field Emission Scanning Electron Microscopy - Application Note
Review of the excellent imagaing capabilities of low-voltage SEM for morphology invertigation of graphene

Notes d’application 2014-08-02

PDF PDF 692 KB
Reducing Cost of Testing Prototypes with the Keysight Medalist i1000D In-Circuit
This case study challenges the conventional adoption of flying probers for board testing at the NPI stage, offering the Keysight Medalist i1000D as a viable option which can help save time and money.

Notes d’application 2014-08-01

Characterizing the I-V Curve of Solar Cells and Modules
This measurement brief explores the various test and measurement tools you can use for I-V curve characterization and provides tips to help you choose the instrument or instruments that best fit your solar cell or module measurement needs.

Notes d’application 2014-07-31

Choosing the Test System Software Architecture - Application Note
This application note is designed to help you quickly design a test system that produces reliable results and meets throughput requirements within budget. It explores the entire software development process, from gathering and documenting software requirements through design reuse considerations.

Notes d’application 2014-07-31

Quantitative Mechanical Measurements at the Nano-Scale Using the DCMII - Application Note

Notes d’application 2014-07-31

PDF PDF 545 KB
Converting Tescon Point 70 Fixtures and Programs for use on the Medalist i1000D
This application describes how users can convert their hardware and software from the Tescon Point 70 platform to the Keysight Medalist i1000D platform to enjoy state-of-the-art in-circuit test technology .

Notes d’application 2014-07-31

PDF PDF 8.81 MB
Improving Test Throughput with ASRU Speedup feature on the Medalist i3070 Series 5
Keysight's Medalist i3070 Series 5 comes with a new Analog Stimulus Response Unit (ASRU N) Revision card along with software release 08.00p. The ASRU N card has enhanced ASRU speedup features to reduce unpowered analog test time.

Notes d’application 2014-07-31

PDF PDF 325 KB
Time Domain Reflectometry Theory - Application Note
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

Notes d’application 2014-07-31

Measuring Stress-Strain Curves for Shale Rock by Dynamic Instrumented Indentation - Application Note
Study of Dynamic instrumented indentation as an ideal way to measure the mechanical properties of shale rock. Note includes samples that can be just a few millimeters in extent, and shows that ion-milling is an adequate method of surface preparation. The note proves that test forces greater than 300mN, the primary results (reduced modulus and hardness) are accurate, repeatable, and relevant.

Notes d’application 2014-06-02

PDF PDF 1.59 MB

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