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Demystifying RCRC and RC probes - Application Note
An ideal probe would provide an exact replica of a signal being probed. However, the probe becomes a part of the circuit under test, because the probe introduces probe loading to the circuit.

Notes d’application 2015-05-11

PDF PDF 1.56 MB
Testing Automotive Electronic Parking Brake Controls with the TS-8989 - Application Note
This application note discusses the configuration of a typical Keysight TS-8989 PXI Functional Test System for testing automotive electronic parking brake controls.

Notes d’application 2015-05-11

PDF PDF 772 KB
Multiport and Multi-site Test Optimization Techniques - Application Note
This app note gives an overview of multiport and multi-site test capabilities, how different multiport test solutions compare, and what should be considered when configuring a multi-site test station.

Notes d’application 2015-05-08

PDF PDF 5.29 MB
The Revolutionary Impact of the Oliver and Pharr Technique - Application Note
Explanation of the Oliver-Pharr method and how it can be used to obtain an equivalent Vickers hardness number

Notes d’application 2015-05-04

PDF PDF 343 KB
Tribology of Dental Enamel: Effect of Etching - Application Brief
In this summary, the nano-tribological behavior of the dental enamel as a function of acid etching is characterized using a nanoindenter.

Notes d’application 2015-05-04

PDF PDF 624 KB
Strain-Rate Sensitivity of Thin Metal Films by Instrumented Indentation – Application Note
A new technique for measuring strain-rate sensitivity by instrumented indentation is presented. This new technique is insensitive to thermal drift and can be used for thin films and other small volumes materials

Notes d’application 2015-05-03

PDF PDF 1.38 MB
Drive Down the Cost of Test Using the ENA Series of Network Analyzers - Application Note
In this application note, we discuss the contributions of Keysight Technologies, Inc.’s ENA Series of Vector Network Analyzers (ENA, hereafter) to drive down the cost of test in production lines.

Notes d’application 2015-05-01

PDF PDF 2.46 MB
Tensile Deformation of Fibers Used in Textile Industry - Application Note
Discussion of UTM T150 used to test four different individual textile fibers — cotton, wool, polyester and rayon — under tensile loading.

Notes d’application 2015-04-30

PDF PDF 2.75 MB
How Much Indentation Testing is enough testing? - Application Note
Overview of how much testing is required to conclude a significant difference between two observation sets at a particular confidence level.

Notes d’application 2015-04-30

PDF PDF 552 KB
In Situ Young’s Modulus and Strain-Rate Sensitivity of Lead Free SAC 105 Solder - Application Note
Overview of how to improve the mechanical reliability of solder joints in integrated circuits, by instrumented indentation to measure the Young’s modulus (E) and strain-rate sensitivity (m) of a common lead-free solder alloy.

Notes d’application 2015-04-30

PDF PDF 521 KB
Mechanical Testing of Shale by Instrumented Indentation - Application Note
Case study of acquiring mechanical properties of fractures in shale

Notes d’application 2015-04-28

PDF PDF 2.67 MB
Performance and Control of the Keysight Nano Indenter DCM - Application Note
Overview of the DCM performance and control on the G200

Notes d’application 2015-04-28

PDF PDF 4.95 MB
Mechanical Testing of Carbon Nanotube Arrays - Application Note
Application note explores the mechanical Testing of Carbon Nanotube Arrays and shows the mode deformation and unusal features in the force displacement data.

Notes d’application 2015-04-28

PDF PDF 967 KB
Boost signals for test and measurement with the right RF and microwave amplifier - Application Note
This application note focuses on RF and microwave amplifiers that are well suited for use in test and measurement applications.

Notes d’application 2015-04-28

PDF PDF 239 KB
Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P - Application Note
This document describes the requirements for forward clocking topology RX Jitter tolerance testing.

Notes d’application 2015-04-24

PDF PDF 2.22 MB
Shopfloor Operation of the Keysight i1000 In-Circuit Test Software - Application Note
This application note helps developers of the shopfloor client to fully understand the format and behavior of the i1000 software files to enable communication between the i1000 and the client.

Notes d’application 2015-04-16

PDF PDF 1.24 MB
Using a Compact Low Voltage FE-SEM in Evaluating Materials Nano-Porosity - Application Note

Notes d’application 2015-04-10

PDF PDF 2.99 MB
Why Magnification is Irrelevant in Modern Scanning Electron Microscopes - Application Note
A detailed explanation on the relative importance of magnification in Field Emission Scanning Electron Microscopy

Notes d’application 2015-04-10

PDF PDF 2.90 MB
Potential of Low Voltage Scanning Electron Microscopy Use in Archaeology/History of Art - App Note

Notes d’application 2015-04-08

PDF PDF 6.94 MB
De-Emphasis Application Note
The N4916A de-emphasis signal converter, an industry-first, enables engineers to accurately characterize multi-gigabit serial receivers and channels that operate with de-emphasized signals.

Notes d’application 2015-04-08

PDF PDF 4.41 MB
Performing LTE & LTE-Advanced RF Measurements with E7515A UXM Wireless Test Set - Application Note
This application note provides insights into example test procedures for RF testing of LTE and LTE-A UEs based on 3GPP TS 36.521-1 V12.2.0 (2014-06).

Notes d’application 2015-03-24

PDF PDF 9.75 MB
Automated X-Ray Inspection System Keysight Technologies - Technical Overview
This is a technical datasheet. Keysight has developed a sealed ultra-high vacumn X-ray tube that provides stable output throughout a significantly long life.

Notes d’application 2015-03-24

PDF PDF 644 KB
Atomic Force Microscopy Studies in Various Environments - Application Note
Overview of using the environmental chamber with water, humidity and gaseous vapors in Polymer research

Notes d’application 2015-03-23

PDF PDF 5.80 MB
Combining Atomic Force Microscopy with Scanning Electrochemical Microscopy - Application Note
Application note discussing the combined AFM-SECM approach with bifunctional probe provides topographical and correlated electrochemical information with high spatial and temporal resolution, thereby enabling the transformation of scanning probe microscopic techniques into multifunctional devices.

Notes d’application 2015-03-22

PDF PDF 1.02 MB
Solid State Switches - Application Note
This application note describes basic switch technology and the different types of Keysight switches. It summarizes the typical performance data of solid-state versus electro-mechanical switches – the two mainstream switch technologies in use today. A basic solid state switch overview which illustrates the theory of operation will give you the in-depth information you need to select the right switch technology for your application.

Notes d’application 2015-03-17

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