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BenchVue Software as an Educational Tool - Application Note
Discover how BenchVue software is a powerful tool for instructional laboratories, as well as for instructors.

Notes d’application 2017-05-19

Achieve Accurate Resistance Measurements with the Keysight 34980A Multifunction Switch Measure Unit
This application note provides an overview of how to make an accurate 2-wire, 3-wire and 4-wire resistance measurements with the Keysight 34980A

Notes d’application 2017-05-16

Using BenchVue Software’s Test Flow Application to Characterize Transistors - Application Note
This application note shows how to make a simple transistor curve tracer using a Keysight B2962A power source along with a Test Flow sequence running in Keysight’s BenchVue software.

Notes d’application 2017-05-16

Achieving Metrology-grade Results in Vector Network Analysis at Millimeter-wave Frequencies
Millimeter-wave expertise and new solution for design, simulation, test and analysis in millimeter wave frequencies.

Notes d’application 2017-05-12

PDF PDF 1.85 MB
Basic Oscilloscope Fundamentals - Application Note
This application note provides an overview of basic oscilloscope fundamentals. You will learn what an oscilloscope is and how to use oscilloscopes.

Notes d’application 2017-04-25

Piezoresponse Force Microscopy using Keysight 9500 AFM - Application Note
PFM has become recognized as a key tool in advancing the research and development of applications based on piezoelectric materials in general. This note shows the capabilities of the 9500 AFM

Notes d’application 2017-04-18

PDF PDF 1.80 MB
eCall/ERA-GLONASS Conformance Testing with Keysight E6950A - Application Note
This application note discusses how designers can use the Keysight eCall test setup to emulate the various elements of a real eCall environment comprising GPS, automobile, cellular network and PSAP.

Notes d’application 2017-04-12

PDF PDF 2.89 MB
EMI Troubleshooting: The Need for Close Field Probes - Application Note
This application note introduces close field probes and explains how specific probes offer distinct advantages in electromagnetic compatibility (EMC) radiated emission pre-compliance test.

Notes d’application 2017-04-03

Understanding the Differences Between Oscilloscopes and Digitizers for Wideband Signal Acquisitions
This white paper compares the use of oscilloscopes and wideband digitizers for wideband signal applications.

Notes d’application 2017-03-30

PDF PDF 6.16 MB
Comprehensive Atomic Force Microscopy with Keysight 9500 Scanning Probe Microscope - App Note
An AFM study of polymers under various environments using AM & Quick Sense Modes. Optimizing the tip torce for characterization of top layer and sub-surface layers.

Notes d’application 2017-03-09

PDF PDF 6.24 MB
Nanomechanical Studies in Atomic Force Microscopy - Application Note
Study of the 9500 AFM using Quick Sense to achieve nanomechanical properties of various materials

Notes d’application 2017-03-09

PDF PDF 4.15 MB
Atomic Force Microscopy of Heterogeneous Materials in Different Environments - Application Note
A study of polymers under different environments using the 9500

Notes d’application 2017-03-09

PDF PDF 5.29 MB
x1149 Boundary Scan Solution for Blade Server Board - Application Note
This application note describes in detail what the Keysight x1149 Boundary Scan Analyzer performs during the Integrity test.

Notes d’application 2017-03-02

PDF PDF 6.17 MB
Eye on 802.11ax:What It Is and How to Overcome the Design & Test Challenges It Creates - White Paper
This white paper introduces key technologies of 802.11ax and presents some unique challenges for the engineers designing and testing 802.11ax devices.

Notes d’application 2017-02-28

PDF PDF 2.52 MB
N437x Lightwave Component Analyzer Automation – Getting Started with SCPI - Application Note
The Keysight N437x Series Lightwave Component Analyzer (LCA) measures the transfer function of electrical to electrical, electrical to optical, optical to electrical, and optical to optical components

Notes d’application 2017-02-23

PDF PDF 1.81 MB
KFM & CSAFM, Environmental Control in Fuel Cell Research for the Automotive Industry - App Note
Explanation of two AFM modes used in automotive research for fuel cells

Notes d’application 2017-02-21

PDF PDF 1.75 MB
Understanding x1149 Integrity Test - Application Note
This application note describes in detail what the Keysight x1149 Boundary Scan Analyzer performs during the Integrity test.

Notes d’application 2017-02-16

PDF PDF 2.48 MB
Signal Analysis Measurement Fundamentals, Optimize Noise Floor, Resolution Bandwidth, and More
Learn measurement fundamentals to optimize your signal analysis for greater insights

Notes d’application 2017-02-13

Accelerating Spurious Emission Measurements Using Fast-Sweep Techniques - Application Note
Searching for spurious emissions can be especially difficult and time-consuming. Learn about techniques you can use to optimize and speed your measurements.

Notes d’application 2017-01-20

Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity - Application Note
Make the most accurate digital measurements by learning how to evaluate oscilloscope sample rates vs. signal fidelity.

Notes d’application 2017-01-11

NFC-A and -B Sideband Measurements - Application Note
This app note shows how to use FFT peak search on an InfiniiVision X-Series scope to measure the amplitude (power levels) and frequency of NFC sidebands, subcarrier and carrier.

Notes d’application 2017-01-09

PDF PDF 2.12 MB
NFC Device Turn-on and Debug - Application Note
This app note shows how to use an InfiniiVision scope to trigger on NFC communication, demodulate the captured RF waveform, and perform various parametric measurements on the demodulated waveform.

Notes d’application 2017-01-09

PDF PDF 1.88 MB
Download latest M8195A AWG application notes - Explore the possibilities in signal generation
Get app notes for digital multilevel signalizing techniques and high-speed coherent optical

Notes d’application 2016-12-09

Download Free Application Notes for new Arbitrary Waveform Generators
Here you can download free application notes for new Arbitrary Waveform Generators (AWGs)

Notes d’application 2016-12-08

High Resolution Imaging with Keysight 9500 AFM - Application Note
This application note demonstrates that the Keysight 9500 AFM is capable of very high-resolution imaging.

Notes d’application 2016-12-08

PDF PDF 1.87 MB

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