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Understanding Oscilloscope Frequency Response & Its Effect on Rise-Time Accuracy - Application Note
In this application note, we review the properties of both Gaussian and flat-response oscilloscopes, then discuss rise time accuracy for each response type. We show that flat-response oscilloscope, give more accurate rise-time measurement than a Gaussian-response oscilloscope of equal bandwidth, and we show you how to estimate the bandwidth you need. The application note will show you which type of frequency response offers the best measurement accuracy; there are two issues to consider, the maximum signal frequency, and the oscilloscope sampling alias errors. It will also determine how much bandwidth you need.

Application Note 2014-07-31

Choosing the Test System Software Architecture - Application Note
This application note is designed to help you quickly design a test system that produces reliable results and meets throughput requirements within budget. It explores the entire software development process, from gathering and documenting software requirements through design reuse considerations.

Application Note 2014-07-31

Evaluation of Bearing Materials Using Nano-Scale Wear Testing - Application Note
This is a study of miniature ball bearings made of steel, polytetrafluoroethylene (PTFE) reinforced with graphite, and polyether ether ketone (PEEK) are evaluated by means of nano-indentation and nano- wear testing

Application Note 2014-06-20

PDF PDF 1.08 MB
Offline vs Inline: Shifting to automated inline ICT - White Paper
This paper discusses the benefits of adopting an inline in-circuit test strategy for electronics manufacturers looking to increase product quality and reliability while ensuring optimal ROIC.

Application Note 2014-05-14

New Investigations into Energy: Keysight Nanomeasurement Systems - Application Note
The data presented demonstrates just a few of the ways in which the latest atomic force microscopy (AFM), nanoindentation, and field-emission scanning electron microscope can be utilized to enhance energy-related materials research.

Application Note 2014-04-24

PDF PDF 2.58 MB
Essentials of Coherent Optical Data Transmission - Application Note
The Application Note explains how complex modulated optical signals can maximize bit transfer efficiency in fiber optical data transmission.

Application Note 2014-04-02

PDF PDF 3.03 MB
Testing Automotive Fuse Boxes with i1000D SFP In-Circuit Test System - Application Note
The i1000D small footprint in-circuit tester provides excellent test coverage for automotive fuse boxes, which contain vital connections to a vehicle's various electrical systems.

Application Note 2014-03-26

Testplan Development on CVI Labwindows with TS-5400 PXI Series - Application Note
This application note provides set-up guidelines to start developing your testplan on CVI Labwindows using the Keysight U8972A TS-5400 PXI Series functional test system.

Application Note 2014-03-25

PDF PDF 5.09 MB
Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note
Specific to instruments that use the Y-factor method for noise figure measurements, this app note discusses measurement basics, avoidable errors, loss and temperature corrections, and uncertainties.

Application Note 2014-02-26

PDF PDF 1.48 MB
High Speed Lightwave Component Analysis - Application Note
The principles and methods are described for measuring the frequency dependence of fiberoptic transponders that convert electrical signals to optical signals and optical to electrical.

Application Note 2014-02-26

Power Supply Connections for Your CET Signal Conditioner Card Application Note
The Cover-Extend Technology signal conditioner card can be powered from various sources. The recommended sources are discussed in this application note.

Application Note 2014-02-25

PDF PDF 435 KB
Rapid Mechanical Properties of Multi-layer Film Stacks - Application Note
In this note, we measure the mechanical properties of 50nm films with remarkable precision and accuracy. The precision is due to Express Test, which performs indentations at a rate of one per second, thereby allowing many indentations to be included in the final determination of modulus and hardness.

Application Note 2014-02-17

PDF PDF 2.29 MB
Using Fast-Sweep Techniques to Accelerate Spur Searches - Application Note
New advances in signal processing provide improvements in sweep speeds by implementing a new type of digital RBW filter in X-Series signal analyzers. This application note focuses on these new improvements.

Application Note 2014-02-11

High Precision Time Domain Reflectometry - Application Note
Time domain reflectometry (TDR) is a well-established technique for verifying the impedance and quality of signal pats in components, interconnects, and transmission lines.

Application Note 2014-01-23

The Handling and Bonding of Beam Lead Devices Made Easy - Application Note
Beam Lead Device handling and protection (from electrostatic discharge) is presented in this publication from 1981.

Application Note 2013-12-09

PDF PDF 4.69 MB
MAC Mode Imaging of Biological Molecules with 7500 AFM - Application Note

Application Note 2013-11-21

PDF PDF 108 KB
What is the difference between an equivalent time and a real-time oscilloscope? - Application Note
This document will discuss how each type of oscilloscope samples the incoming waveform and explain the trigger requirements.

Application Note 2013-11-18

Contact Deformation of LiNbO3 Single Crystal:Dislocations, Twins and Ferroelectric Domains
A Study of a combined nanoindentation and AFM investigation showing that twinning and dislocation motion are two major deformation mechanisms under contact loading in periodically poled (0001) LiNbO3.

Application Note 2013-11-01

PDF PDF 752 KB
Determining Critical Stresses in Semiconductors: Using ZnO Crystal & GaN Freestanding Film
A study of the nanoindenter G200 used to perform spherical nanoindentation experiments on ZnO single crystal and GaN freestanding film.

Application Note 2013-10-30

PDF PDF 363 KB
Problem with Subtype Learning When Used with the Connector Algorithm in R7.0
5DX Technical Paper - Problem with Subtype Learning When Used with the Connector Algorithm in R7.0

Application Note 2013-10-29

PDF PDF 16 KB
Eight Hints for Better Scope Probing - Application Note
In this application note, you will find eight useful hints for selecting the right probe for your application and for making your oscilloscope probing better.

Application Note 2013-10-28

High Resolution Imaging with 7500 AFM - Application Note

Application Note 2013-10-24

PDF PDF 266 KB
Humidity-dependent AFM Nanolithography - Application Note

Application Note 2013-10-21

PDF PDF 107 KB
Mapping the Mechanical Properties of Cement-based Materials Using CSM &Ultra-fast Nanoindentation
Study of hydration mechanisms of a commercial cement paste that has been h investigated with the use of the G200 using innovative statistical ultra-fast nanoindentation.

Application Note 2013-10-15

PDF PDF 930 KB
Tribology of Dental Enamel: Effect of Etching - Application Brief
In this summary, the nano-tribological behavior of the dental enamel as a function of acid etching is characterized using a nanoindenter.

Application Note 2013-10-09

PDF PDF 214 KB

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