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The Handling and Bonding of Beam Lead Devices Made Easy - Application Note
Beam Lead Device handling and protection (from electrostatic discharge) is presented in this publication from 1981.

Application Note 2013-12-09

PDF PDF 4.69 MB
MAC Mode Imaging of Biological Molecules with 7500 AFM - Application Note

Application Note 2013-11-21

PDF PDF 108 KB
What is the difference between an equivalent time and a real-time oscilloscope? - Application Note
This document will discuss how each type of oscilloscope samples the incoming waveform and explain the trigger requirements.

Application Note 2013-11-18

Contact Deformation of LiNbO3 Single Crystal:Dislocations, Twins and Ferroelectric Domains
A Study of a combined nanoindentation and AFM investigation showing that twinning and dislocation motion are two major deformation mechanisms under contact loading in periodically poled (0001) LiNbO3.

Application Note 2013-11-01

PDF PDF 752 KB
Determining Critical Stresses in Semiconductors: Using ZnO Crystal & GaN Freestanding Film
A study of the nanoindenter G200 used to perform spherical nanoindentation experiments on ZnO single crystal and GaN freestanding film.

Application Note 2013-10-30

PDF PDF 363 KB
Problem with Subtype Learning When Used with the Connector Algorithm in R7.0
5DX Technical Paper - Problem with Subtype Learning When Used with the Connector Algorithm in R7.0

Application Note 2013-10-29

PDF PDF 16 KB
Eight Hints for Better Scope Probing - Application Note
In this application note, you will find eight useful hints for selecting the right probe for your application and for making your oscilloscope probing better.

Application Note 2013-10-28

High Resolution Imaging with 7500 AFM - Application Note

Application Note 2013-10-24

PDF PDF 266 KB
Humidity-dependent AFM Nanolithography - Application Note

Application Note 2013-10-21

PDF PDF 107 KB
Mapping the Mechanical Properties of Cement-based Materials Using CSM &Ultra-fast Nanoindentation
Study of hydration mechanisms of a commercial cement paste that has been h investigated with the use of the G200 using innovative statistical ultra-fast nanoindentation.

Application Note 2013-10-15

PDF PDF 930 KB
Tribology of Dental Enamel: Effect of Etching - Application Brief
In this summary, the nano-tribological behavior of the dental enamel as a function of acid etching is characterized using a nanoindenter.

Application Note 2013-10-09

PDF PDF 214 KB
Nanotribology of Hard Thin Film Coatings: A Case Study Using the G200 Nanoindenter
Case study of the changes in elastic modulus and hardness of thin film as measured using the nanoindenter and the continuous stiffness measurement option, which measures the mechanical properties as a continuous function of depth.

Application Note 2013-09-30

PDF PDF 469 KB
In Situ Electrochemical Measurements Using the 7500 AFM - Application Note

Application Note 2013-09-27

PDF PDF 178 KB
Single Molecule Force Spectroscopy (SMFS) Using the 7500 AFM - Application Note

Application Note 2013-09-24

PDF PDF 285 KB
Elastic Modulus Mapping Using the 7500 AFM - Application Note

Application Note 2013-09-24

PDF PDF 138 KB
Measuring Jitter in Digital Systems (AN 1448-1) - Application Brief
This application note is for R&D designers and engineers working on high-speed digital designs. It addresses jitter measurements in digital circuits, how the different measurement techniques are best applied, and how these decisions may change as the data rates increase.

Application Note 2013-09-16

PDF PDF 1.78 MB
Vapor Annealing Effect on Copolymers Studied by 7500 AFM with Environmental Control-Application Note

Application Note 2013-09-16

PDF PDF 116 KB
Surface Potential Measurements Using the Keysight 7500 AFM - Application Note

Application Note 2013-09-13

PDF PDF 452 KB
The Revolutionary Impact of the Oliver and Pharr Technique on the Science of Hardness Testing
Explanation of the Oliver-Pharr method and how it can be used to obtain an equivalent Vickers hardness number

Application Note 2013-09-13

PDF PDF 120 KB
Humidity-dependent Surface Chemistry Studied by 7500 Atomic Force Microscopy - Application Note

Application Note 2013-09-12

PDF PDF 117 KB
7500 AFM Applications in Polymer Materials - Application Note

Application Note 2013-09-12

PDF PDF 186 KB
Magnetic Force Microscopy Studies Using the Keysight 7500 AFM - Application Note

Application Note 2013-09-12

PDF PDF 287 KB
Current Sensing AFM Measurements Using 7500 AFM - Application Note

Application Note 2013-09-12

PDF PDF 98 KB
The Impedance Measurement Handbook-4th Edition - Application Note
This 140 page handbook is Keysight Technologies's most detailed information on the basics of impedance measurements using Keysight Technologies's LCR meters and impedance analysers. It provides the theory, test set-upinformation, error discussion, etc.

Application Note 2013-09-10

The Benefits of Updating Your 3499A/B/C Switching System to the 34980A Switch/Measure Unit
This application note will describe differences and advantages of the new 34980A as compared to the 3499A/B/C.

Application Note 2013-08-15

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