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How to Test a MIPI M-PHY High-speed Receiver - Challenges and Keysight Solutions - Application Note
This application selectively describes critical parts of the MIPI M-Phy-specification and related receiver (RX) tests. It describes the main properties of the M-Phy interface.

Application Note 2013-08-06

PDF PDF 6.63 MB
RS-232 Troubleshooting - Application Note
In the course of dealing with personal computers, you may use the RS-232 serial interface. This application note will describe RS-232 at a basic level, with an orientation towards Windows®- based instrument programming.

Application Note 2013-07-31

PDF PDF 111 KB
Electromagnetic Simulations at the Nanoscale: EMPro Modeling and Comparison to SMM Experiments
In this application note, we describe electromagnetic (EM) simulations using Keysight Technologies’ EMPro software to support the interpretation of scanning microwave microscope (SMM) experiments.

Application Note 2013-07-30

PDF PDF 2.45 MB
Strain-Rate Sensitivity of Thin Metal Films by Instrumented Indentation - Application Note
A new technique for measuring strain-rate sensitivity by instrumented indentation is presented. This new technique is insensitive to thermal drift and can be used for thin films and other small volumes materials

Application Note 2013-07-30

PDF PDF 2.29 MB
Configuring Boundary Scan Chains on Keysight x1149 Boundary Scan Analyzer - Application Note
This application note provides the procedure for configuring the boundary scan chain of a board using the Keysight x1149 boundary scan analyzer.

Application Note 2013-07-30

PDF PDF 890 KB
Solutions for Testing NFC Devices
Using an accurate, configurable and versatile test bench with qualified test tools to address test challenges throughout the NFC product development cycle

Application Note 2013-07-29

Merging boards on Keysight x1149 Boundary Scan Analyzer – Application Note
This application note shows how to connect two or more boards to form a single boundary scan chain using the Keysight x1149 boundary scan analyzer.

Application Note 2013-07-26

PDF PDF 1.85 MB
Achieve Accurate Two Wire Resistance Measurements with the Keysight 34923A and 34924A Multiplexers -
This application note provides an overview of how to make an accurate two-wire resistance measurement with the Keysight 34980A and a multiplexer.

Application Note 2013-07-24

Overcome PCB Loss, Deliver a Clean Eye to Your DUT Using Multi-tap De-emphasis - Application Brief
This application brief describes how Keysight’s 32 Gb/s Pattern Generator with integrated 5-tap de-emphasis can overcome PCB and connector loss and deliver a clean eye to the DUT.

Application Note 2013-07-16

PDF PDF 2.23 MB
In Vitro Complex Shear Modulus of Bovine Muscle Tissue - Application Note
Overview of how dynamic instrumented indentation provides a way to measure the mechanical properties of soft biological tissue

Application Note 2013-06-17

PDF PDF 1.09 MB
MOI for SATA RSG Tests, SATA Interoperability Program Rev. 1.5 - Application Note
Serial ATA Interoperability Program Revision 1.5 Keysight MOI for SATA RSG Tests

Application Note 2013-06-10

PDF PDF 2.45 MB
Charging Mitigation Strategies in Imaging Insulating Polymer Spheres via Low Voltage Field Emission

Application Note 2013-05-03

PDF PDF 987 KB
Increasing Manufacturing Throughput of Automotive Controllers - Application Note
This application note describes how automotive manufacturers can boost throughput using the Keysight TS-5400 Series 3 high performance PXI function test system for multiple devices under test.

Application Note 2013-04-18

PDF PDF 783 KB
Radar Distance Test to Airborne Planes - Application Note
Keysight pulse pattern generators are used for testing military radar communication systems, and as demonstrated in this publication, the aviation industry.

Application Note 2013-04-11

PDF PDF 904 KB
Tensile Testing of Fibers using Keysight T150 UTM Quasi-static Tensile Test
The Keysight T150 UTM is a specifically designed instrument to measure the tensile properties of wide range of fibers with small cross-sectional diameters. this application note discussed testing of various fibers

Application Note 2013-04-08

PDF PDF 188 KB
Three Compelling Reasons for Deep Acquisition Memory
This app note discusses deep memory's value. While acquisition memory depth is often used as a primary purchase consideration, the associated benefits require additional thought to fully appreciate.

Application Note 2013-03-14

How Much Indentation Testing is enough testing? - Application Note
Overview of how much testing is required to conclude a significant difference between two observation sets at a particular confidence level.

Application Note 2013-03-13

PDF PDF 384 KB
In Situ Young’s Modulus and Strain-Rate Sensitivity of Lead Free SAC 105 Solder - Application Note
Overview of how to improve the mechanical reliability of solder joints in integrated circuits, by instrumented indentation to measure the Young’s modulus (E) and strain-rate sensitivity (m) of a common lead-free solder alloy.

Application Note 2013-03-12

PDF PDF 312 KB
Evaluating Oscilloscope Fundamentals - Application Note
We will discuss oscilloscope applications and give you an overview of basic measurements and performance characteristics.

Application Note 2013-03-06

Graphene Studies: Utilization of Atomic Force Microscopy for Nanoscale Investigations of Graphene

Application Note 2013-03-04

PDF PDF 738 KB
Jitter Measurements on Long Patterns Using 86100DU-401 Advanced Waveform Analysis - Application Note
To overcome pattern length limitations found in many of today’s jitter analysis tools, Keysight developed a Microsoft Office Excel-based application called 86100DU Option 401 Advanced Waveform Analysis

Application Note 2013-02-21

PDF PDF 3.47 MB
Quality Measures for Complex Modulated Signals Reaching for Standardization - Application Note
Complex modulation is now being broadly accepted in optical data transmission. The app note investigates if the quality parameters are ready to be standardized and to replace traditional parameters.

Application Note 2013-02-19

Pulse Parameter Definitions - Application Note
Here you find the pulse parameter definitions of terms used in the instrument specifications of Pulse Pattern Generators. Model Nos: 81110A, 81111A, 81112A, 81150A, 81160A, 81130A, 81131A, 81132A, 81133A, 81134A, 81180B, M8190A

Application Note 2013-02-14

PDF PDF 793 KB
Optimize burn-in test with the Keysight 34980A multifunction switch/measure unit apnote overview
This application overview will discuss the complexities of burn-in test based on the Keysight 340980A switch/measure unit

Application Note 2013-01-31

PDF PDF 440 KB
Evolution of Dynamic Mechanical Properties of Nylon-PET Island-in-the-Sea Biocomponent Fibers
Study of mechanical properties of individual nylon-PET bicomponent IS fibers, with two different PET molecular weights, were characterized using the Keysight T150 UTM.

Application Note 2013-01-10

PDF PDF 265 KB

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