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Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note
Specific to instruments that use the Y-factor method for noise figure measurements, this app note discusses measurement basics, avoidable errors, loss and temperature corrections, and uncertainties.

Notes d’application 2014-02-26

The Handling and Bonding of Beam Lead Devices Made Easy - Application Note
Beam Lead Device handling and protection (from electrostatic discharge) is presented in this publication from 1981.

Notes d’application 2013-12-09

The Benefits of Updating Your 3499A/B/C Switching System to the 34980A Switch/Measure Unit
This application note will describe differences and advantages of the new 34980A as compared to the 3499A/B/C.

Notes d’application 2013-08-15

Achieve Accurate Two Wire Resistance Measurements with the Keysight 34923A and 34924A Multiplexers -
This application note provides an overview of how to make an accurate two-wire resistance measurement with the Keysight 34980A and a multiplexer.

Notes d’application 2013-07-24

Achieve Accurate Resistance Measurements with the Keysight 34980A Multifunction Switch Measure Unite
This application note provides an overview of how to make an accurate 2-wire, 3-wire and 4-wire resistance measurements with the Keysight 34980A

Notes d’application 2013-07-10

Optimize burn-in test with the Keysight 34980A multifunction switch/measure unit apnote overview
This application overview will discuss the complexities of burn-in test based on the Keysight 340980A switch/measure unit

Notes d’application 2013-01-31

34980A Measurements Made Easy
This document includes examples with the few steps needed to make measurements using the 34980A's 1) front panel, 2) built-in web interface, and 3) Command Expert software.

Notes d’application 2012-12-26

USB Coaxial Switches for RF & Microwave Test and Measurement Applications - Application Note
This application note describes features and application examples for the U1810B USB coaxial switch, with options for measuring multiple DUT or performing multiple tasks with a single connection.

Notes d’application 2012-11-28

Achieve Measurement Accuracy and Flexibility in Your Microwave Test System Ap Note
The application note describes how to enhance measurement accuracy and flexibility in signal analysis by using the M9168C PXI programmable step attenuator module.

Notes d’application 2012-08-24

Comparing the Keysight 34980A and PXI for Switch Measurement Applications
This application note provides a comparison between PXI cardcage solutions and a combined system, the Keysight 34980A switch/measure unit, so you can determine which platform best meets your needs for electronic functional test and data acquisition.

Notes d’application 2012-04-27

Microwave and Millimeter Signal Measurements: Tools and Best Practices Application Note
Accurate microwave and millimeter frequency signal measurements are important in many applications. This note will help you make the right choices and steps to get accurate, reliable measurements.

Notes d’application 2012-04-26

Making Good Thermocouple Measurements
This application note provides tips for optimizing thermocouple measurements in a noisy environment.

Notes d’application 2012-01-26

Practical Temperature Measurements (AN-290)
The purpose of this application note is to explore the more common temperature measurement techniques, and introduce procedures for improving their accuracy.

Notes d’application 2012-01-26

Selecting the Correct Temperature Sensor for Your Application
This application note provides tips for selecting the correct temperature sensor.

Notes d’application 2012-01-25

Design Tutorial: E5061B ENA Custom Multiport Switch Solution Using L4491A
This application note describes how to configure a 12-port custom switch box with the L4491A switch platform and operation basics using the E5061B network analyzer.

Notes d’application 2011-11-29

Switching Solutions
This paper discusses Keysight's complete line of switching solutions. Switch components are introduced, followed by the various scale of switch matrix that is required in RF and microwave testing.

Notes d’application 2010-11-18

Fundamentals of RF and Microwave Noise Figure (AN 57-1)
This 32-page, black-and-white application note providesinformation on RF and Microwave noise figure measurementts. Topics include noise figure and temperature, noise characteristics of two-port networks, and the measurement of noise figure.

Notes d’application 2010-08-05

Selecting the right switch technology for your application
This application note describes basic switch technology and the different types of Keysight switches.

Notes d’application 2010-05-27

Understanding RF/Microwave Solid State Switches and their Applications
This note explains FET, PIN diode and hybrid solid state switches. It discusses benefits/disadvantages of each type of switch, which specifications to consider and why, and gives application examples.

Notes d’application 2010-05-21

Measuring Frequency Response with E5061B LF Network Analyzer
This application note describes fundamentals on low frequency network analysis by featuring the E5061B LF-RF network analyzer. Here we mainly discuss simple low frequency 2-port device measurements and associated topics.

Notes d’application 2010-04-28

Efficient use of data logging and decision making w multiple scan lists
Basic data logging allows you to confi gure different measurements across multiple channels, then record the data.

Notes d’application 2010-04-07

Types of Data Acquisition Architectures
To help you choose a system that meets your needs, this article explains the different types of data acquisition system architectures and explores some of the advantages and disadvantages.

Notes d’application 2010-02-01

Solar Cell and Module Testing
This application note describes how to decrease costs and increase flexibility for solar cell and module testing with Keysight products and solutions.

Notes d’application 2009-12-07

Characterizing the I-V Curve of Solar Cells and Modules
This measurement brief explores the various test and measurement tools you can use for I-V curve characterization and provides tips to help you choose the instrument or instruments that best fit your solar cell or module measurement needs.

Notes d’application 2009-12-02

Tips for Optimizing Your Switch Matrix Performance
This application note offers eight tips to help you optimize your measurement matrix switching performance and important features to remember when designing your switching solution.

Notes d’application 2009-10-22

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