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Time Domain Reflectometry Theory - Application Note
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

Application Note 2015-01-30

LTE RF Conformance and DV Test System - Technical Overview
The T4010S LTE RF test systems are automated solutions for conformance test and design verification of LTE UE. This document covers key benefits, features, technical specifications and ordering info.

Technical Overview 2015-01-29

Mapping the Mechanical Properties of SAC 305 Solder with Express Test - Application Note
The note discusses the use of nano-indentation to map the mechanical properties of a SAC 305 solder joint, because electronic reliability depends on mechanical integrity. Traditional nano-indentation testing time for such mapping, would have been prohibitively long but with the Express Test we were able to generate quantitative and highly resolved hardness maps in about an hour.

Application Note 2015-01-28

PDF PDF 778 KB
U1881A and U1882A Measurement Application for InfiniiVision and Infiniium Oscilloscopes - Data Sheet
The U1881A and U1882A power measurement applications for Keysight oscilloscopes provide a full suite of power measurements.

Data Sheet 2015-01-28

E5080A ENA Series Network Analyzer - Data Sheet
This literature describes the technical specifications for E5080A and E5092A.

Data Sheet 2015-01-28

PDF PDF 2.90 MB
8157xA Optical Attenuators - Data Sheet
Keysight 8157xA Variable Optical Attenuators are instruments that attenuate and control the optical power level of light in single mode optical fibers. As plug-in modules for Agilent's Lightwave Solution platform (8163A/B, 8164A/B, 8166A/B) they allow you to set the attenuation factor and/or power level manually, or remotely via a common computer interface. Their high accuracy combined with their flexibility make them ideal as test and measurement equipment for the modern telecommunication industry.

Technical Overview 2015-01-26

Instructions for Using the Electronic Calibration (ECal) Kit Storage Box
Provides instructions for determining which of the foam inserts inside the storage box are removed to hold the ECal module and accessories.

User Manual 2015-01-23

PDF PDF 137 KB
86100D-9FP PAM-N Analysis Software for 86100D DCA-X Oscilloscopes - Data Sheet
The 86100D-9FP PAM-N analysis software for 86100D DCA-X Series oscilloscopes helps you quickly and accurately analyze electrical and optical Pulse Amplitude Modulated (PAM) signals.

Data Sheet 2015-01-23

PDF PDF 3.16 MB
HDMI and DisplayPort Design and Test – A Better Way - Brochure
Brochure covering Keysight’s HDMI and Displayport test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.

Brochure 2015-01-23

PDF PDF 11.70 MB
J-BERT offers adjustable and integrated inter-symbol interference
J-BERT offers adjustable and integrated inter-symbol interference

Press Materials 2015-01-22

Keysight Extends UXM Wireless Test Set LTE-A Carrier Aggregation Support with 3CC, TDD, Uplink
The E7515A UXM wireless test set adds features to address the rapidly evolving 3GPP LTE-Advanced carrier aggregation advancements.

Press Materials 2015-01-21

SMM EMPro - Application Note
In this application note, we describe electromagnetic (EM) simulations using Keysight Technologies’ EMPro software to support the interpretation of scanning microwave microscope (SMM) experiments.

Application Note 2015-01-20

PDF PDF 2.43 MB
Measuring Stress-Strain Curves for Shale Rock by Dynamic Instrumented Indentation - Application Note
Study of Dynamic instrumented indentation as an ideal way to measure the mechanical properties of shale rock. Note includes samples that can be just a few millimeters in extent, and shows that ion-milling is an adequate method of surface preparation. The note proves that test forces greater than 300mN, the primary results (reduced modulus and hardness) are accurate, repeatable, and relevant.

Application Note 2015-01-19

PDF PDF 1.17 MB
A Comparative Microscopy Imaging Study on Tissue Specimens - Application Note

Application Note 2015-01-17

PDF PDF 1.92 MB
85054B 50 Ohm Type-N Calibration Kit User's and Service Guide
Provides user's and service information including specifications; use, maintenance and care of the devices; performance verification; troubleshooting; replaceable parts; and standard definitions for the 85054B 50 Ohm Type-N Calibration Kit.

User Manual 2015-01-15

PDF PDF 955 KB
85054D Type-N Economy Calibration Kit User's and Service Guide
Provides user's and service information including specifications; use, maintenance and care of the devices; performance verification; troubleshooting; replaceable parts; and standard definitions.

User Manual 2015-01-15

PDF PDF 808 KB
J-BERT N4903B High-Performance Serial BERT - Data Sheet
Updated J-BERT N4903B data sheet revision 1.3. Especially PCIe3 related enhancements covered by our PR in Jan 2013. Also covers all enhancements since SW releases 6.80 to 7.40

Data Sheet 2015-01-14

E1987, E6785 Fast Switching - User's Guide
Click here to access the online User’s Guide for TA/LA Fast Switching applications.

User Manual 2015-01-12

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E1962, E6702 cdma/IS-95/AMPS Online User's Guide
Click here to access the online User’s Guide for cdma2000/IS-95/AMPS applications.

User Manual 2015-01-12

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E1969 TD-SCDMA GSM Fast Switch Online User's Guide
Click here to access the online User’s Guide for the TD-SCDMA GSM Fast Switch

User Manual 2015-01-12

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E1963, E6703 W-CDMA/HSPA - User's Guide
The most current documentation for the W-CDMA/HSPA application is this online version. Easy to use, no PDF downloads!

User Manual 2015-01-12

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E1966, E1976, E6706 1xEV-DO - User's Guide
Click here to access the online User’s Guide for WCDMA/HSPA applications.

User Manual 2015-01-12

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E1968, E6701, E6704 GSM/GPRS User's Guide
Click here to access the online User’s Guide for GSM/GPRS/EGPRS applications.

User Manual 2015-01-12

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Introduction to SECM and Combined AFM-SECM - Application Note
Introduction to Scanning electrochemical microscopy (SECM) is a powerful scanning probe technique, which is suitable for investigating surface reactivity, and processes at the solid/liquid as well as liquid/liquid interface.

Application Note 2015-01-11

PDF PDF 607 KB
Transmit/Receive Module Test Platform (TRM-X) - Technical Overview
The TRM-X Test Platform, measurement science expertise and systems when and where needed, provide the capability you need to deliver AESA radar; datalink; and satcom transmit/receive modules.

Technical Overview 2015-01-10

PDF PDF 1.83 MB

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