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AFM/SPM Accessories - Brochure

Brochure 2016-03-24

PDF PDF 5.34 MB
N2771B 30 kV High Voltage Probe User's Guide
Describes how to use the Keysight N2771B 30 kV high voltage probe.

Manuel de l'utilisateur 2016-03-23

PDF PDF 173 KB
E5052B Signal Source Analyzer - Data Sheet
This 21-page data sheet provides technical specifications for the E5052B (10 MHz to 7 GHz) signal source analyzer and the E5053A Downconverter (3 GHz to 26.5 GHz). The E5052B is a single-instrument solution that offers an indispensable set of measurement functions for evaluating RF & microwave signal sources such as VCOs, crystal oscillators, SAW oscillators, dielectric resonator oscillators, YIG oscillators, PLL synthesizers, RFICs, and L.O. circuits.

Fiche signalétique 2016-03-23

Introduces Tunable Laser Sources for Testing Data Center Devices, Integrated Components
+17dBm Enables Verification of Silicon Photonics Designs, New O-Band Option Accelerates High-Volume Testing

Dossier de presse 2016-03-23

N1810/1/2 Coaxial Switches - Technical Overview
This technical overview describes the N181X coaxial switch series. It includes a description of the many different options available that make the series very versatile. Also included are detailed line drawings and specification tables for each switch.

Présentation technique 2016-03-22

E1738A Air Temperature/Pressure/Humidity Sensor - Data Sheet
This environmental sensor is used with the Keysight E1736A USB Sensor Hub as part of the 5530 Laser Calibration System.

Fiche signalétique 2016-03-14

RF and RRM Conformance Test System Leads Industry in PTCRB RF LTE 3CA Certification

Dossier de presse 2016-03-13

Using Nanomeasurement Systems for Nanoscale Investigations of Graphene - Application Note

Notes d’application 2016-03-11

PDF PDF 7.96 MB
Mini In-Circuit Tester - Data Sheet
Keysight Mini In-Circuit Tester is a modular in-circuit test unit fitting a typical 19-inch rack to flexibly complement existing tests in your manufacturing line to increase defects test coverage.

Fiche signalétique 2016-03-07

Benefits of Keysight Bead Probe Technology
Keysight Bead Probe Technology is a test methodology to help electronics manufacturers regain ICT access on today’s increasingly dense PCBs as well as designs with high-speed circuits.Keysight Bead Probe Technology is a test methodology to help electronics manufacturers regain ICT access on today’s increasingly dense PCBs as well as designs with high-speed circuits.

Article 2016-03-03

Mini In-Circuit Tester - Application Note
This application note discusses the SCPI commands and the potential use models with the modular Keysight Mini In-Circuit Tester.

Notes d’application 2016-03-02

Demonstrate LTE-A Pro 1Gbps IP Data Throughput with UXM Wireless Test Set at Mobile World Congress

Dossier de presse 2016-03-02

N5990A MIPI-PHY Frame Generator Language Guide
Edition 1.0, March 2016

Manuel de l'utilisateur 2016-03-01

PDF PDF 222 KB
N5416A/B USB 2.0 Compliance Test Option, Notes on Electrical Testing
This manual contains notes on the electrical tests that are performed by the USB 2.0 compliance test option; it describes the equipment used, and it describes how the tests are performed.

Guide de références 2016-03-01

PDF PDF 15.95 MB
U3042AE04 User’s and Service Guide
The Keysight U3042AE04 Multiport Test Set is a 4-Port solid-state extension test set. When combined with a 4-Port PNA, PNA-L, or PNA-X Network Analyzer, the U3042AE04 provides a complete solution for 8-Port full crossbar measurements

Manuel de l'utilisateur 2016-03-01

PDF PDF 10.30 MB
N5256AW01, N5262AW01-W28, N5256AR01 and N5262AR01-R28 Extension Modules
N5256AW01 and N5262AW01-W15 Transceiver Modules (Tx/Rx) and the N5256AR01 and N5262AR01-R15 Receiver Modules (Rx) are manufactured by Virginia Diodes, Inc. (VDI). The transceiver and receiver modules may be used with the Keysight N5222/24/25/27A PNA or N5242/44/45/47A PNA-X with Options 080 and 400 or 224, or the Keysight N5261/62A Controller to configure a banded millimeter-wave network analyzer system.

Manuel de l'utilisateur 2016-03-01

PDF PDF 351 KB
U2300A Series User’s Guide
User’s guide for the U2300A Series Multifunction USB Data Acquisition. Contains a description of the features and functions of the instrument, including programming information, application examples, and technical specifications.

Manuel de l'utilisateur 2016-03-01

Data Sheet for Cal Kit 85562A 2.92 (m) mm DC to 40 GHz
Your calibration kit has been designed to withstand a moderate amount of physical stress. However, to retain its high precision performance you should treat it with care and prevent any mechanical shock.

Fiche signalétique 2016-03-01

PDF PDF 138 KB
N2839A InfiniiMax II Differential Browser Quick Reference
Describes how to use the browser and accessories and how to replace probe tips.

Guide de démarrage rapide 2016-03-01

PDF PDF 327 KB
N2114A & N2115A DDR4 BGA Interposer for Oscilloscopes User Guide
Provides installation information for the Keysight N2114A x4/x8 DDR4 BGA interposer and the N2115A x16 DDR4 BGA interposer.

Manuel de l'utilisateur 2016-03-01

PDF PDF 5.43 MB
E6640A EXM Wireless Test Set Getting Started Guide
Getting started information for the E6640A EXM wireless test set.

Manuel de l'utilisateur 2016-03-01

PDF PDF 4.45 MB
1130A-Series Differential and Single-Ended Probes User’s Guide
This book provides user and service documentation for the Keysight Technologies 1130A-Series differential and single-ended probes.

Manuel de l'utilisateur 2016-03-01

PDF PDF 4.49 MB
N5990A Installation Guide
N5990A Installation Guide

Manuel de l'utilisateur 2016-03-01

PDF PDF 462 KB
Valiframe UHS Test User's Guide
Edition 1.0, March 2016

Manuel de l'utilisateur 2016-03-01

PDF PDF 2.94 MB
Recommended Probe Configurations for 1168A and 1169A Active Probes
This quick reference card has two sides. Side one shows how to connect the probe to your target system for optimum performance. Side two shows other configurations that may be used but may not provide optimum performance.

Guide de démarrage rapide 2016-03-01

PDF PDF 1.22 MB

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