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PNA Family Microwave Network Analyzers - Configuration Guide
This configuration guide describes standard configurations, options, accessories, upgrade kits and compatible peripherals for the PNA Family microwave network analyzers.

Guide de configuration 2015-05-06

PDF PDF 2.77 MB
Network Analyzer - Selection Guide
Provides an overview of Keysight’s network analyzer families, recommended solutions for various applications, related network analyzer products, and a comparison of specifications and features.

Guide de sélection 2015-05-05

Tribology of Dental Enamel: Effect of Etching - Application Brief
In this summary, the nano-tribological behavior of the dental enamel as a function of acid etching is characterized using a nanoindenter.

Notes d’application 2015-05-04

PDF PDF 624 KB
The Revolutionary Impact of the Oliver and Pharr Technique - Application Note
Explanation of the Oliver-Pharr method and how it can be used to obtain an equivalent Vickers hardness number

Notes d’application 2015-05-04

PDF PDF 343 KB
Strain-Rate Sensitivity of Thin Metal Films by Instrumented Indentation – Application Note
A new technique for measuring strain-rate sensitivity by instrumented indentation is presented. This new technique is insensitive to thermal drift and can be used for thin films and other small volumes materials

Notes d’application 2015-05-03

PDF PDF 1.38 MB
Service Guide for Infiniium 90000 X-Series Oscilloscopes
This guide contains the service information for the 90000 X-Series oscilloscopes.

Manuels d'entretien 2015-05-01

PDF PDF 5.76 MB
85032B and 85032E 50 Ohm Type-N Calibration Kit User's and Service Guide
Provides user's and service information including specifications; use, maintenance and care of the devices; performance verification; troubleshooting; replaceable parts; and standard definitions.

Manuel de l'utilisateur 2015-05-01

PDF PDF 567 KB
Drive Down the Cost of Test Using the ENA Series of Network Analyzers - Application Note
In this application note, we discuss the contributions of Keysight Technologies, Inc.’s ENA Series of Vector Network Analyzers (ENA, hereafter) to drive down the cost of test in production lines.

Notes d’application 2015-05-01

PDF PDF 2.46 MB
85058B/E 1.85 mm Calibration Kits User's and Service Guide
Provides user and service information for 85058B/E 1.85 mm calibration kits which are used to calibrate analyzers up to 67 GHz.

Manuel de l'utilisateur 2015-05-01

PDF PDF 1.15 MB
85036B/E 75 Ohm Type-N Calibration Kit Operating and Service Manual
Provides general information, specifications, and replacement part numbers for the 85036B/E 75 Ohm Type-N Calibration Kit.

Manuel de l'utilisateur 2015-05-01

PDF PDF 1.05 MB
M8195A Arbitrary Waveform Generator - User's Guide
The M8195A is a 65 GSa/s Arbitrary Waveform Generator with the highest combination of speed, bandwidth and channel density. Flexible signal generation at up to 32 Gbaud. Clean and distorted signal to stress the device to the limits.

Manuel de l'utilisateur 2015-05-01

Programmer's Guide for Infiniium Oscilloscopes (PDF)
This is a printable PDF version of the Infiniium Oscilloscopes Programmer's Guide.

Guide de programmation et de syntaxe 2015-05-01

PDF PDF 7.12 MB
Programmer's Guide for Infiniium Oscilloscopes
This is a zipped Microsoft Windows® format help file. Extract this file to a Local Disk (a Windows security requirement); on Windows XP, you may have to open the file's Properties dialog and Unblock the file before opening.

Guide de programmation et de syntaxe 2015-05-01

ZIP ZIP 1.85 MB
Tensile Deformation of Fibers Used in Textile Industry - Application Note
Discussion of UTM T150 used to test four different individual textile fibers — cotton, wool, polyester and rayon — under tensile loading.

Notes d’application 2015-04-30

PDF PDF 2.75 MB
E6640A EXM Wireless Test Set - Brochure
EXM is ready to test devices with 2G, 3G, and 4G cellular, including LTE-A CA, plus wireless connectivity. For NPI to high-volume manufacturing test this brochure explains its extensive capabilities.

Brochure 2015-04-30

PDF PDF 6.92 MB
In Situ Young’s Modulus and Strain-Rate Sensitivity of Lead Free SAC 105 Solder - Application Note
Overview of how to improve the mechanical reliability of solder joints in integrated circuits, by instrumented indentation to measure the Young’s modulus (E) and strain-rate sensitivity (m) of a common lead-free solder alloy.

Notes d’application 2015-04-30

PDF PDF 521 KB
8473D Planar-Doped Barrier Detector Data Sheet

Fiche signalétique 2015-04-30

PDF PDF 242 KB
How Much Indentation Testing is enough testing? - Application Note
Overview of how much testing is required to conclude a significant difference between two observation sets at a particular confidence level.

Notes d’application 2015-04-30

PDF PDF 552 KB
L Series Multiport Electromechanical Coaxial Switches - Technical Overview
This technical overview of the economically-priced L7104A/BC and L7106A/B/C terminated and L7204A/BC and L7206A/B/C unterminated multiport coaxial switches, DC to 26.5 GHz, provides a product overview, description, applications, specifications and ordering information.

Présentation technique 2015-04-29

87204/87206A, B, C Multiport Coaxial Switches - Technical Overview
This document contains product description, top line specs, and ordering information for high performance multiport switches for microwave and RF instrumentation and systems. Additional model# 70611A Products: 87206B, 87204A, 87204B, 87204C, 87206A, 87206B, 87206C

Présentation technique 2015-04-29

PDF PDF 1 MB
Boost signals for test and measurement with the right RF and microwave amplifier - Application Note
This application note focuses on RF and microwave amplifiers that are well suited for use in test and measurement applications.

Notes d’application 2015-04-28

PDF PDF 239 KB
Understanding the Operation and Usage of Manufacturing Execution Systems - Technical Overview
This paper gives an overview of how typical manufacturing execution systems work on the production floor, with examples of MES connectivity with shopfloor clients to enable specific applications

Présentation technique 2015-04-28

PDF PDF 1.81 MB
Mechanical Testing of Shale by Instrumented Indentation - Application Note
Case study of acquiring mechanical properties of fractures in shale

Notes d’application 2015-04-28

PDF PDF 2.67 MB
Mechanical Testing of Carbon Nanotube Arrays - Application Note
Application note explores the mechanical Testing of Carbon Nanotube Arrays and shows the mode deformation and unusal features in the force displacement data.

Notes d’application 2015-04-28

PDF PDF 967 KB
Performance and Control of the Keysight Nano Indenter DCM - Application Note
Overview of the DCM performance and control on the G200

Notes d’application 2015-04-28

PDF PDF 4.95 MB

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