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Device Modeling and Characterization Products

Our products and premier solutions provide for characterization and modeling of cutting-edge CMOS and compound semiconductor devices. Keysight is the only vendor that provides complete end-to-end modeling solutions, from automated measurements, accurate device model extraction, comprehensive qualification to final process design kit (PDK) validation. Comprehensive modeling services are offered, supported by Keysight’s expert engineers and advanced labs. Our key device modeling and characterization EDA software and hardware solutions are included below.

Key Benefits of Device Modeling Products

  • Integrated Circuit Characterization and Analysis Program (IC-CAP) is a versatile and user programmable industry standard for semiconductor device modeling
  • Model Builder Program (MBP) is a complete Silicon turnkey device modeling software
  • Model Quality Assurance (MQA) is the industry standard SPICE model signoff and acceptance software
  • WaferPro Express supports wafer-level measurement and programming test software for use with a variety of instruments and wafer probes.
  • Advanced Low-Frequency Noise Analyzer (A-LFNA) supports on-wafer measurement and analysis of flicker noise and random telegraph noise

Learn about Device Modeling and Characterization

  • IC-CAP Device Modeling Software IC-CAP Device Modeling Software 

    IC-CAP Device Modeling Software

    Industry standard for DC and RF semiconductor device modeling. IC-CAP extracts accurate compact models used in high speed/digital, analog and power RF circuit design applications.

  • Model Builder Program (MBP) Model Builder Program (MBP) 

    Model Builder Program (MBP)

    • Built-in SPICE engine for fast simulation
    • Automated extraction packages for industry standard models
    • Turnkey solutions for specialty modeling 
    • Full support of hierarchical, complex foundry libraries
    • Flexibility for customization

  • Model Quality Assurance (MQA) Model Quality Assurance (MQA) 

    Model Quality Assurance (MQA)

    • Complete QA flow on one platform
    • One common language (i.e. rule file) for all simulators
    • Comprehensive checking routines and simulators support
    • Automated and flexible reporting functions
    • Fully understand device behavior for your design requirements

  • WaferPro Express WaferPro Express 

    WaferPro Express

    • Turnkey test algorithms and instrument drivers
    • A modern and intuitive user interface
    • Advanced tools such as Data Display, Wafer Mapping Data Viewer and the SQL database
    • Python/PEL programming environment

  • E4727A Advanced Low-Frequency Noise Analyzer E4727A Advanced Low-Frequency Noise Analyzer 

    E4727A Advanced Low-Frequency Noise Analyzer

    • Wafer mapping measurement and data analysis of flicker noise and random telegraph noise
    • Modular design minimizes system noise
    • Software supports wafer mapping measurement and data analysis
    • Support for BJT, FET, Diode, Resistor, Op Amps and Comparators

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