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B1500A Semiconductor Device Parameter Analyzer and Measurement Modules

Keysight B1500A Semiconductor Device Analyzer of Precision Current-Voltage Analyzer Series is an all in one analyzer supporting IV, CV, pulse/dynamic IV and more, which is designed for all-round characterization from basic to cutting-edge applications. It provides a wide range of measurement capabilities to cover the electrical characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency. In addition, the B1500A’s modular architecture with ten available slots allows you to add or upgrade measurement modules if your measurement needs change over time.

Keysight EasyEXPERT group+ GUI based characterization software is available either on the B1500A’s embedded Windows 7 platform with 15-inch touch screen or on your PC to accelerate the characterization tasks. It supports efficient and repeatable device characterization in the entire characterization process from measurement setup and execution to analysis and data management either interactive manual operation or automation across a wafer in conjunction with a semiautomatic wafer prober. EasyEXPERT group+ makes it easy to perform complex device characterization immediately with hundreds of ready-to-use measurements (application tests) furnished, and allows you the option of storing test condition and measurement data automatically after each measurement in a unique built-in database (workspace), ensuring that valuable information is not lost and that measurements can be repeated at a later date. Keysight B1500A provides the complete solution for device characterization with these versatile capabilities.

B1500A supports various modules and allows you to configure them up to 10 slots, according to your measurement needs. Standard SMU modules enable to perform various IV measurements such as spot, sweep, sampling measurements. Moreover, Quasi-Static CV (QSCV) measurement is also supported by SMU. MFCMU modules supports capacitance measurement and easy and yet IV/CV switching with the optional SCUU. WGFMU enables ultra-fast pulsed IV and dynamic IV measurement for cutting-edge applications based on arbitrary waveform sourcing and fast digitizing measurement capabilities. The combination of these modules cover various applications.
 

You can learn more about B1500A applications here.

  • B1500A Semiconductor Device Parameter Analyzer/Semiconductor Characterization System Mainframe B1500A Semiconductor Device Parameter Analyzer/Semiconductor Characterization System Mainframe 

    B1500A Semiconductor Device Parameter Analyzer/Semiconductor Characterization System Mainframe

    • Configurable and upgradeable measurement modules up to 10 slots
    • EasyEXPERT group+ software on embedded Windows 7
    • Ready to use measurement libraries
    • 15-inch touch screen for intuitive operation, analysis and exploration for characterization

  • B1514A (B1500A-A1A, B1500AU-141) 50 µs Pulse Medium Current Source/Measure Unit (MCSMU) B1514A (B1500A-A1A, B1500AU-141) 50 µs Pulse Medium Current Source/Measure Unit (MCSMU) 

    B1514A (B1500A-A1A, B1500AU-141) 50 µs Pulse Medium Current Source/Measure Unit (MCSMU)

    • A wide pulse range up to 30 V / 1 A (0.1 A DC)
    • Pulse width down to 50 µs with 2 μs resolution (10 times faster pulse than other SMUs of B1500A)
    • Oscilloscope view is supported to confidently verify the pulsed measurement setup and optimize its parameters quickly and easily
       

  • B1530A (B1500A-A30, B1500AU-030) Waveform Generator/Fast Measurement Unit (WGFMU) B1530A (B1500A-A30, B1500AU-030) Waveform Generator/Fast Measurement Unit (WGFMU) 

    B1530A (B1500A-A30, B1500AU-030) Waveform Generator/Fast Measurement Unit (WGFMU)

    • High speed (200 MSa/s)measurement capability for pulsed IV and transient IV measurements
    • Arbitrary waveform generation with 10 ns resolution
    • No load line effect accurate pulsed IV measurement
    • Wide current range by dynamic ranging capability

  • B1510A/B1511B/B1517A (B1500A-A10/A11/A17) Source Measure Units (SMUs) B1510A/B1511B/B1517A (B1500A-A10/A11/A17) Source Measure Units (SMUs) 

    B1510A/B1511B/B1517A (B1500A-A10/A11/A17) Source Measure Units (SMUs)

    • 4-quadrant source and measurement for accurate IV characterization down to fA
    • Measurement range 0.1 fA - 1 A / 0.5 µV - 200 V
    • Spot, sweep, pulse and sampling measurement capabilities
    • QS-CV measurement with leak current compensation

  • B1520A (B1500A-A20, B1500AU-020) Multi Frequency Capacitance Measurement Unit (MFCMU) B1520A (B1500A-A20, B1500AU-020) Multi Frequency Capacitance Measurement Unit (MFCMU) 

    B1520A (B1500A-A20, B1500AU-020) Multi Frequency Capacitance Measurement Unit (MFCMU)

    • Multi frequency AC impedance measurement capability for CV, C-t and C-f measurement
    • Frequency range from 1 kHz to 5 MHz
    • 25 V built-in DC bias and 100 V DC bias with SMU and SCUU Easy and fast yet accurate IV and CV measurements by the SCUU

  • B1525A (B1500A-A25, B1500AU-025) High Voltage Semiconductor Pulse Generator Unit  (HV-SPGU) B1525A (B1500A-A25, B1500AU-025) High Voltage Semiconductor Pulse Generator Unit (HV-SPGU) 

    B1525A (B1500A-A25, B1500AU-025) High Voltage Semiconductor Pulse Generator Unit (HV-SPGU)

    • High voltage output up to ±40 V applicable for non-volatile memory evaluations
    • Two-level and three-level pulse capability is supported by each channel
    • Flexible arbitrary waveform generation with 10 ns resolution
    • Two channels per modules

  • B1542A 10 ns Pulsed IV Parametric Test Solution B1542A 10 ns Pulsed IV Parametric Test Solution 

    B1542A 10 ns Pulsed IV Parametric Test Solution

    • Best solution for High-K/SOI pulsed IV characterization 
    • Min 10 ns gate pulse width with 2 ns rise and fall times
    • 1 µs current measurement resolution
    • Supported instruments: B1500A, E5270B, E5260A, E5262A/63A, 4155B/C, and 4156B/C