Contact an Expert

Source Measure Units

A Source/Measure Unit, or SMU, is a source and measurement resource for test applications requiring high accuracy, high resolution and measurement flexibility. SMUs are sometimes also referred to as source monitor units. An SMU can precisely force voltage or current and simultaneously measure voltage and/or current.

Keysight Technologies is the leader in the Source/Measure and Source/Monitor Unit (SMU) market. Keysight provides a wide range of SMU products, which are categorized into four areas: Precision, Application Specific, General-Purpose, and Basic.

Refine the List

remove all refinements

By Type of Content

By Product Category

1-18 of 18

Sort:
16442B User Guide
Provides installation information, operation, maintenance information, and specification of the 16442B Test Fixture for B1500A, B2900 Series, and E5260/E5270 Series.

User Manual 2014-08-15

PDF PDF 618 KB
The parametric Measurement Handbook
This handbook describes how to evaluate accurate current, voltage, or capacitance measurement by explaining parametric measurement basic

Brochure 2014-01-22

B1542A Pulsed IV Package User's Guide
Covers operation, installation, and reference information of Pulsed IV Package for B1500A/EasyEXPERT.

User Manual 2012-02-01

PDF PDF 4.16 MB
E5270B Parametric Measurement Solution TIS User's Guide
TIS user's guide for E5270B

Programming and Syntax Guide 2011-08-01

PDF PDF 727 KB
E5260/E5270 Parametric Measurement Solution VXIplug&play Driver User's Guide
VXIplug&play Driver User's Guide for E5270B/E5260A/E5262A/E5263A

Programming and Syntax Guide 2011-08-01

PDF PDF 965 KB
E5260/E5270 Parametric Measurement Solution User's Guide
User's Guide for E5270B/E5260A/E5262A/E5263A

User Manual 2011-08-01

Top 5 Reasons to Use Keysight Precision SMU Products for Solar Cell Evaluation
Keysight Parameter & Device Analyzers can improve the yields and efficiencies of your solar cells.

Promotional Materials 2009-08-05

PDF PDF 539 KB
High Speed Modeling System with IC-CAP
Keysight has new modeling system configurations that meet the needs of advanced semiconductor processes.

Application Note 2008-08-21

E5260/E5270 Parametric Measurement Solution Programming Guide
Pogramming Guide for E5270B/E5260A/E5262A/E5263A

Programming and Syntax Guide 2008-05-01

Technical Overview :Technique for Controlling Keysight External DC Power Supply
Technique for Controlling Keysight External DC Power Supply From SMU to expand SMU output power capability.

Application Note 2006-08-01

PDF PDF 1.01 MB
16495C/D/E/F/G/H/J Connector Plate Installation Guide
Provides installation information of 16495 Connector Plate.

Installation Manual 2005-07-01

PDF PDF 638 KB
E5270B 8 Slot Precision Measurement Mainframe
The E5270B is completely user-configurable. You can install up to eight single-slot modules, up to four dual-slot modules, or any physically allowable combination thereof.

Technical Overview 2004-09-01

High Speed L-I-V Test of Laser Diode Using Keysight E5272A/E5273A AN E5270-4
This application note introduces a technique of programming for high speed L-I-V test of Laser Diode in production.

Application Note 2003-10-17

Evaluation of High Voltage Characteristics of Semiconductor Processes and Devices to 400V AN E5270-3
This application note introduces a technique for expanding the output voltage using the SMU of the Keysight E5270A 8-slot Parametric Measuremnet Mainframe.

Application Note 2003-10-06

PDF PDF 544 KB
E5270B Parametric Measurement Solution Quick Reference
A 2-page quick reference guide to using the E5270B from the front panel.

Quick Start Guide 2003-10-01

PDF PDF 714 KB
Accurate High Power Device Evaluation to 4 Amperes Using Keysight E5270A AN E5270-1
This application note provides information how to obtain accurate results up to 4A using the E5270A and added flexible modules.

Application Note 2003-09-19

PDF PDF 739 KB
High Speed fT vs. Ic characterization of Bipolar transisitor Using E5270A and ENA AN E5270-2
This application note shows how to perform high-speed fT vs. Ic characterization of bipolar transistor by using Keysight E5270A and ENA series RF Network Analyzer.

Application Note 2003-08-10

Tips for Reusing Existing 4142B Program for Keysight E5270A Parametric Measurement Mainframe
The purpose of this technical overview is to provide an example of a systematic approach for finding non-operative 4142B program modules or lines in the E5270A instrument,,,

Application Note 2003-05-10

PDF PDF 310 KB