Source Measure Unit
A Source/Measure Unit, or SMU, is a source and measurement resource for test applications requiring high accuracy, high resolution and measurement flexibility. SMUs are sometimes also referred to as source monitor units. An SMU can precisely force voltage or current and simultaneously measure voltage and/or current.
Keysight Technologies is the leader in the Source/Measure and Source/Monitor Unit (SMU) market. Keysight provides a wide range of SMU products, which are categorized into four areas: Precision, Application Specific, General-Purpose, and Basic.
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- Spécifications (30)
- Manuels (52)
- Notes d’application (94)
- Dépliants et révisions compétitives (29)
- Guide de sélection & de configuration (12)
- Brefs de solution (4)
- Démos (17)
- Articles et études de cas (2)
- Catalogues (4)
- Communiqués de presse (5)
Par catégorie de produit
- B1500A Semiconductor Device Parameter Analyzer and Measurement Modules (65)
- B2900A Series Precision Source/Measure Units (SMU) (70)
- Modular SMU Series (E5270B, E5260A, E5262A and E5263A) (29)
- N6785A Source/Measure Unit for Battery Drain Analysis, Multiple Ranges, 80 W, Double-wide (16)
- N6786A Source/Measure Unit for Functional Test, Multiple Ranges, 80 W, Double-wide (15)
- N6781A 2-Quadrant Source/Measure Unit for Battery Drain Analysis, 20 V, ±1 A or 6 V, ±3 A, 20 W (19)
- N6782A 2-Quadrant Source/Measure Unit for Functional Test, 20 V, ±1 A or 6 V, ±3 A, 20 W (14)
- N6784A 4-Quadrant General-Purpose Source/Measure Unit, ±20 V, ±1 A or ±6 V, ±3 A, 20 W (13)
- N6705B DC Power Analyzer, Modular, 600 W, 4 Slots (42)
- N6715B Base Model Custom-Configured DC Power Analyzer, 600 W, Modular, 4 Slots (29)
- B1505A Power Device Analyzer / Curve Tracer (58)
- E5260A IV Analyzer / 8 Slot Precision Measurement Mainframe (23)
- E5262A 2 Channel IV Analyzer / Source Monitor Unit (Two Medium Power SMUs) (22)
- E5270B Precision IV Analyzer / 8 Slot Precision Measurement Mainframe (25)
- E5263A 2 Channel IV Analyzer / Source Monitor Unit (High Power SMU and Medium Power SMU) (22)
- U2722A USB Modular Source Measure Unit (22)
- U2723A USB Modular Source Measure Unit (20)
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|IV Characterizations of Solar Cells Using the B2900A Series of SMUs - Application Note
The Keysight B2900A Series Precision SMU allows you to accurately and quickly make characterization of photovoltaic cells with its intuitive GUI and free PC-based application software.
Notes d’application 2015-12-14
|LIV Test of Laser Diode Using the B2900A Series of SMUs-Application Note
This application introduces features of B2900A Series as the best solution for LIV test of laser diode.
Notes d’application 2015-12-03
|Diode Evaluation Using the B2900A Series of SMUs - Application Note
This application note shows how the Keysight B2900A Series Precision SMU allows you to accurately and easily measure the basic IV parameters and characteristics of diodes.
Notes d’application 2015-12-02
|Optoelectronic IC/Component Evaluation - Application Brief
This 2-page application brief describes "Quick Bench-top Evaluation" of an optoelectronic component (optocoupler) and shows real measurement results made by B2900A series.
Notes d’application 2015-11-24
|B2901A/02A/11A/12A Precision Source/Measure Unit (SMU) - Product Fact Sheet
The B2900A Series Precision Source/Measure unit is the best solution for a broad range of IV measurements. It has innovative GUI for quickly evaluating the input/output characteristics of DUTs.
PDF 1.34 MB
|Wide Range of Resistance Measurement Solutions from μΩ to PΩ - Application Brief
This application brief summarizes Keysight's resistance measurement solution. The detailed information can be seen 5992-1212EN application note.
Notes d’application 2015-11-18
|Wide Range of Resistance Measurement Solutions from µΩ to PΩ - Application Note
This application note introduces keysight's resistance measurement solution, and discuss major error factors in resistance measurements and how to eliminate those error factors.
Notes d’application 2015-11-17
|Precision Device Characterization Solution Using the B2900A Series - Application Brief
This 2-page application brief introduces the precision device characterization solution using the B2900A precision source/measure unit.
Notes d’application 2015-11-11
|A Source/Measurement Unit Based Teaching Lab Solution Package for MEMS Technologies - Brochure
This 2-page introduces the Keysight B2902A/12A Source/Measure Unit based Teaching Lab Solution Package for MEMS Technologies.
PDF 807 KB
|Quick Start Guide for E5260/E5270 Series
A step-by-step guide to understand an overview of the E5260 series and the E5270B Precision IV analyzer and setup files used in it.
Guide de démarrage rapide 2015-10-30
PDF 5.96 MB
|Power Products October 2015 - Selection Guide
This selection guide will help you select the right DC power supply for your application (for example, basic power supply, specialized requirements or more complex requirements).
PDF 3.95 MB
|Ensure your mobile and smart devices comply with the CTIA Battery Life Test Plan – W2BI
Ensure your mobile and smart devices comply with the CTIA Battery Life Test Plan – W2BI and Keysight
Brefs de solution 2015-10-09
|N678xA Source/Measure Units Configuration Guide
Contains essential configuration information for the N678xA Source Measure Units in PDF format
Guide de configuration 2015-10-01
PDF 533 KB
|Evaluating Adaptive Fast USB Battery Charging of Mobile Devices - Application Note
To offset greater power consumption, today’s mobile devices are now incorporating larger batteries; and the consequences are it takes longer to recharge due to the marginal power delivery of USB.
Notes d’application 2015-09-16
|Challenges and Solutions for Power Electronics Testing Applications - Technical Overview
This technical overview introduces Keysight solutions for power electronics applications.
Présentation technique 2015-09-03
|E5260/E5270 Parametric Measurement Solution User's Guide
User's Guide for E5270B/E5260A/E5262A/E5263A
Manuel de l'utilisateur 2015-09-01
|B1542A Ten Nanosecond Pulsed IV Parametric Test Solution - Technical Overview
This note shows outline of B1500A Semicondcutor Device Analyzer Ultra-Short Pulsed IV solution.
Présentation technique 2015-08-06
|Pulsed-IV Parametric Test Solutions - Selection Guide
This Pulsed-IV selection guide provides an overview and side-by-side comparison of all of Agilent's pulsed-IV parametric test solutions to determine the best solution to meet your unique needs.
Guide de sélection 2015-07-20
|B1500A Semiconductor Device Analyzer - Technical Overview
This technical overview describes the complete device characterization solution covering measurement needs from basic IV and CV to ultra-fast pulsed and transient IV measurement using the B1500A semiconductor device analyzer.
Présentation technique 2015-07-16
|E5260/E5270 Precision IV Analyzer Configuration and Connection Guide
This configuration guide will help you determine which modules, options and accessories to include with your E5260/E5270, and will also explain detailed connection with examples.
Guide de configuration 2015-07-06
PDF 2.11 MB
|B1500A Semiconductor Device Analyzer Configuration and Connection Guide
This configuration guide will help you determine which modules, options and accessories to include with your B1500A, and will also explain detailed connection with examples.
Guide de configuration 2015-06-30
PDF 3.16 MB
|Challenges and Solutions for Power Testing in Automotive Applications - Technical Overview
This technical overview provides a synopsis of automotive electronic systems, the challenges they face and what tools automotive electronics engineers need to meet them. It concludes with a discussion of Keysight’s solutions to these challenges.
Présentation technique 2015-06-25
|B1530A Waveform Generator/Fast Measurement Unit User's Guide
Covers product overview and installation information for Keysight B1530A. Also covers programming examples and reference information of Instrument Library for B1530A.
Manuel de l'utilisateur 2015-06-19
PDF 2 MB
|Measuring a dynamic on-resistance characteristics in GaN FET using N1267A HVSMU/HCSMU fast switch
Reference guide to perform a dynamic on-resistance / current collapse measurement in GaN FET using the Keysight N1267A HVSMU/HCSMU fast switch
Guide de références 2015-06-16
PDF 10.14 MB
|EasyEXPERT Software Self-paced Training Manual
Self-paced training manual for EasyEXPERT Software.
Manuel de l'utilisateur 2015-05-30
PDF 46.65 MB