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Atomic Force Microscopes, FE-SEM, Nanoindenters, UTM

 


Research Resources

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Atomic Force Microscopy Studies in Various Environments - Application Note
Overview of using the environmental chamber with water, humidity and gaseous vapors in Polymer research

Notes d’application 2015-03-23

PDF PDF 5.80 MB
7500 STM Scanner - Data Sheet

Fiche signalétique 2015-03-23

PDF PDF 104 KB
Combining Atomic Force Microscopy with Scanning Electrochemical Microscopy - Application Note
Application note discussing the combined AFM-SECM approach with bifunctional probe provides topographical and correlated electrochemical information with high spatial and temporal resolution, thereby enabling the transformation of scanning probe microscopic techniques into multifunctional devices.

Notes d’application 2015-03-22

PDF PDF 1.02 MB
Compositional Mapping of Materials with Single Pass Kelvin Force Microscopy - Application Note
Applications of single-pass KFM showing that the mode complements phase imaging in compositional mapping of complex materials.

Notes d’application 2015-03-13

PDF PDF 8.09 MB
Introduction to Scanning Microwave Microscopy - Application Note

Notes d’application 2015-02-12

PDF PDF 1.49 MB
High Resolution Scanning Probe Microscopy in Controlled Environments - Application Note
This Application Note reports investigations involving high resolution SPM experiments with Keysight Technologies SPMs working in a glove box environment without compromising the SPM performance.

Notes d’application 2015-02-02

PDF PDF 1.57 MB
SMM EMPro - Application Note
In this application note, we describe electromagnetic (EM) simulations using Keysight Technologies’ EMPro software to support the interpretation of scanning microwave microscope (SMM) experiments.

Notes d’application 2015-01-20

PDF PDF 2.43 MB
Introduction to SECM and Combined AFM-SECM - Application Note
Introduction to Scanning electrochemical microscopy (SECM) is a powerful scanning probe technique, which is suitable for investigating surface reactivity, and processes at the solid/liquid as well as liquid/liquid interface.

Notes d’application 2015-01-11

PDF PDF 607 KB
Using Nanomeasurement Systems for Nanoscale Investigations of Graphene - Application Note

Notes d’application 2015-01-07

PDF PDF 7.95 MB
7500 Atomic Force Microscope (AFM) - Data Sheet

Fiche signalétique 2014-12-29

PDF PDF 4.40 MB
Differentiating Surface Mechanical Properties with Dynamic Lateral Force Microscopy-Application Note

Notes d’application 2014-12-16

PDF PDF 2.06 MB
Electrical Measurement - Application Note
Overview of electrical measurements using AFM in various modes

Notes d’application 2014-12-15

PDF PDF 4.11 MB
SMM Imaging of Dopant Structures of Semiconductor Devices - Application Note

Notes d’application 2014-12-10

PDF PDF 2.33 MB
How to choose your MAC Lever - Technical Overview

Présentation technique 2014-12-09

PDF PDF 168 KB
Attaching Antibodies to AFM Probes with Sulfhydryl Reactive PEG Tether NHS-PEG18-PDP - App Note

Notes d’application 2014-12-08

PDF PDF 329 KB
Attaching Antibodies to MAC Levers with the Bifunctional Amine-Amine Reactive PEG Tether - App Note

Notes d’application 2014-12-08

PDF PDF 742 KB
Scanning Microwave Microscope Mode - Application Note

Notes d’application 2014-12-04

PDF PDF 320 KB
Temperature Control - Data Sheet

Fiche signalétique 2014-11-17

PDF PDF 491 KB
Post Processing Pico Image Software for Keysight AFM Systems - Data Sheet
Pico Image surface imaging and analysis software is dedicated to Keysight AFMs and SPMs. It contains three levels for basic, advanced, and expert users. Standalone and network licenses are available.

Fiche signalétique 2014-11-13

PDF PDF 671 KB
Liquid Cell and Sample Plate - Data Sheet

Fiche signalétique 2014-11-06

PDF PDF 891 KB
5600LS High Resolution Large Stage AFM - Data Sheet

Fiche signalétique 2014-11-06

PDF PDF 712 KB
PicoLITH, Keysight Lithography and Nanomanipulation Package – Data Sheet
Lithography and nanomanipulation software that provides for scanning probe microscopy (SPM) researchers. It allows users to sketch various shapes on a canvas (including lines, poly-lines, circles) that can then be mapped to a real sample surface.

Fiche signalétique 2014-11-03

PDF PDF 491 KB
MAC Mode - Data Sheet

Fiche signalétique 2014-11-03

PDF PDF 1.08 MB
Nanotribological Studies of Lubricating Thin Films by Friction Force Microscopy - Application Note

Notes d’application 2014-09-04

PDF PDF 1.43 MB
7500 ILM Atomic Force Microscope (AFM) - Data Sheet
The 7500 inverted light microscope (ILM) system combines the power of a high-resolution atomic force microscope (AFM) with the direct optical viewing capability of an inverted optical microscope.

Fiche signalétique 2014-05-07

PDF PDF 135 KB

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