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Atomic Force Microscopes, FE-SEM, Nanoindenters, UTM

 

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Combining Atomic Force Microscopy with Scanning Electrochemical Microscopy - Application Note

Notes d’application 2014-05-07

PDF PDF 1.44 MB
7500 ILM Atomic Force Microscope (AFM) - Data Sheet
The 7500 inverted light microscope (ILM) system combines the power of a high-resolution atomic force microscope (AFM) with the direct optical viewing capability of an inverted optical microscope.

Fiche signalétique 2014-05-07

PDF PDF 135 KB
Introduction to SECM and Combined AFM-SECM - Application Note

Notes d’application 2014-05-07

PDF PDF 962 KB
New Investigations into Energy: Keysight Nanomeasurement Systems - Application Note
The data presented demonstrates just a few of the ways in which the latest atomic force microscopy (AFM), nanoindentation, and field-emission scanning electron microscope can be utilized to enhance energy-related materials research.

Notes d’application 2014-04-24

PDF PDF 3.67 MB
AFM - Enabled Scanning Electrochemical Microscope (SECM) - Data Sheet
The AFM combined with SECM mode is a seamlessly integrated technology package that enables scientists to perform scanning electrochemical microscopy (SECM) on conductive and insulating samples with a state-of-the-art atomic force microscope

Fiche signalétique 2014-04-21

PDF PDF 103 KB
MAC Mode Imaging of Biological Molecules with 7500 AFM - Application Note

Notes d’application 2013-11-21

PDF PDF 163 KB
7500 Atomic Force Microscope (AFM) - Data Sheet

Fiche signalétique 2013-11-21

PDF PDF 997 KB
Differentiating Surface Mechanical Properties with Dynamic Lateral Force Microscopy-Application Note

Notes d’application 2013-10-26

PDF PDF 331 KB
High Resolution Imaging with 7500 AFM - Application Note

Notes d’application 2013-10-24

PDF PDF 520 KB
Humidity-dependent AFM Nanolithography - Application Note

Notes d’application 2013-10-21

PDF PDF 128 KB
In Situ Electrochemical Measurements Using the 7500 AFM - Application Note

Notes d’application 2013-09-27

PDF PDF 142 KB
Elastic Modulus Mapping Using the 7500 AFM - Application Note

Notes d’application 2013-09-24

PDF PDF 234 KB
Single Molecule Force Spectroscopy (SMFS) Using the 7500 AFM - Application Note

Notes d’application 2013-09-24

PDF PDF 226 KB
Vapor Annealing Effect on Copolymers Studied by 7500 AFM with Environmental Control-Application Note

Notes d’application 2013-09-16

PDF PDF 184 KB
Surface Potential Measurements Using the Keysight 7500 AFM - Application Note

Notes d’application 2013-09-13

PDF PDF 452 KB
7500 AFM Applications in Polymer Materials - Application Note

Notes d’application 2013-09-12

PDF PDF 274 KB
Current Sensing AFM Measurements Using 7500 AFM - Application Note

Notes d’application 2013-09-12

PDF PDF 122 KB
Magnetic Force Microscopy Studies Using the Keysight 7500 AFM - Application Note

Notes d’application 2013-09-12

PDF PDF 524 KB
Humidity-dependent Surface Chemistry Studied by 7500 Atomic Force Microscopy - Application Note

Notes d’application 2013-09-12

PDF PDF 157 KB
5500 Atomic Force Microscope (AFM) - Data Sheet

Fiche signalétique 2013-08-30

AFM/SPM Accessories - Brochure

Brochure 2013-08-28

PDF PDF 1.17 MB
Electromagnetic Simulations at the Nanoscale: EMPro Modeling and Comparison to SMM Experiments
In this application note, we describe electromagnetic (EM) simulations using Keysight Technologies’ EMPro software to support the interpretation of scanning microwave microscope (SMM) experiments.

Notes d’application 2013-07-30

PDF PDF 592 KB
AFM/Raman System - Data Sheet
Features and benefits of the 6000ILM Raman System

Fiche signalétique 2013-05-07

PDF PDF 307 KB
Graphene Studies: Utilization of Atomic Force Microscopy for Nanoscale Investigations of Graphene

Notes d’application 2013-03-04

PDF PDF 738 KB
5600LS AFM Enhanced Sample Versatility: 2-Inch Multi-Sample Wafer Vacuum Chuck

Fiche signalétique 2013-03-01

PDF PDF 135 KB

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