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Atomic Force Microscopes, FE-SEM, Nanoindenters, UTM

 

 Research Resources

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Single Molecule Force Spectroscopy (SMFS) Using the 7500 AFM - Application Note

Application Note 2013-09-24

PDF PDF 226 KB
Elastic Modulus Mapping Using the 7500 AFM - Application Note

Application Note 2013-09-24

PDF PDF 234 KB
Vapor Annealing Effect on Copolymers Studied by 7500 AFM with Environmental Control-Application Note

Application Note 2013-09-16

PDF PDF 184 KB
Surface Potential Measurements Using the Keysight 7500 AFM - Application Note

Application Note 2013-09-13

PDF PDF 452 KB
The Revolutionary Impact of the Oliver and Pharr Technique on the Science of Hardness Testing
Explanation of the Oliver-Pharr method and how it can be used to obtain an equivalent Vickers hardness number

Application Note 2013-09-13

PDF PDF 120 KB
Magnetic Force Microscopy Studies Using the Keysight 7500 AFM - Application Note

Application Note 2013-09-12

PDF PDF 524 KB
7500 AFM Applications in Polymer Materials - Application Note

Application Note 2013-09-12

PDF PDF 274 KB
Current Sensing AFM Measurements Using 7500 AFM - Application Note

Application Note 2013-09-12

PDF PDF 122 KB
Humidity-dependent Surface Chemistry Studied by 7500 Atomic Force Microscopy - Application Note

Application Note 2013-09-12

PDF PDF 157 KB
5500 Atomic Force Microscope (AFM) - Data Sheet

Data Sheet 2013-08-30

AFM/SPM Accessories - Brochure

Brochure 2013-08-28

PDF PDF 1.17 MB
Effect of Annealing on 50nm Gold Films - Application Note
Overview of Express Test used to evaluate the effect of annealing on 50nm gold films. The note proves that vacuum annealing for three hours (sub 300°C) causes the hardness to decrease by 4.3% – 6.7% with99.9% confidence

Application Note 2013-08-20

PDF PDF 192 KB
Electromagnetic Simulations at the Nanoscale: EMPro Modeling and Comparison to SMM Experiments
In this application note, we describe electromagnetic (EM) simulations using Keysight Technologies’ EMPro software to support the interpretation of scanning microwave microscope (SMM) experiments.

Application Note 2013-07-30

PDF PDF 2.45 MB
Strain-Rate Sensitivity of Thin Metal Films by Instrumented Indentation - Application Note
A new technique for measuring strain-rate sensitivity by instrumented indentation is presented. This new technique is insensitive to thermal drift and can be used for thin films and other small volumes materials

Application Note 2013-07-30

PDF PDF 2.29 MB
In Vitro Complex Shear Modulus of Bovine Muscle Tissue - Application Note
Overview of how dynamic instrumented indentation provides a way to measure the mechanical properties of soft biological tissue

Application Note 2013-06-17

PDF PDF 1.09 MB
AFM/Raman System - Data Sheet
Features and benefits of the 6000ILM Raman System

Data Sheet 2013-05-07

PDF PDF 307 KB
Charging Mitigation Strategies in Imaging Insulating Polymer Spheres via Low Voltage Field Emission

Application Note 2013-05-03

PDF PDF 987 KB
Tensile Testing of Fibers using Keysight T150 UTM Quasi-static Tensile Test
The Keysight T150 UTM is a specifically designed instrument to measure the tensile properties of wide range of fibers with small cross-sectional diameters. this application note discussed testing of various fibers

Application Note 2013-04-08

PDF PDF 188 KB
How Much Indentation Testing is enough testing? - Application Note
Overview of how much testing is required to conclude a significant difference between two observation sets at a particular confidence level.

Application Note 2013-03-13

PDF PDF 384 KB
In Situ Young’s Modulus and Strain-Rate Sensitivity of Lead Free SAC 105 Solder - Application Note
Overview of how to improve the mechanical reliability of solder joints in integrated circuits, by instrumented indentation to measure the Young’s modulus (E) and strain-rate sensitivity (m) of a common lead-free solder alloy.

Application Note 2013-03-12

PDF PDF 312 KB
Graphene Studies: Utilization of Atomic Force Microscopy for Nanoscale Investigations of Graphene

Application Note 2013-03-04

PDF PDF 738 KB
5600LS AFM Enhanced Sample Versatility: 300mm Wafer Vacuum Chuck

Data Sheet 2013-03-01

PDF PDF 131 KB
5600LS AFM Enhanced Sample Versatility: 2-Inch Multi-Sample Wafer Vacuum Chuck

Data Sheet 2013-03-01

PDF PDF 135 KB
Evolution of Dynamic Mechanical Properties of Nylon-PET Island-in-the-Sea Biocomponent Fibers
Study of mechanical properties of individual nylon-PET bicomponent IS fibers, with two different PET molecular weights, were characterized using the Keysight T150 UTM.

Application Note 2013-01-10

PDF PDF 265 KB
Rapid Hardness of Nano-Structured Metals - Application Note
A method to radiply characterize copper-nickel multilayers wherein inindividual layers vary in thickness between 1nm and 100nm is demonstrated and discussed.

Application Note 2013-01-03

PDF PDF 127 KB

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