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Atomic Force Microscopes, FE-SEM, Nanoindenters, UTM

 

 Research Resources

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Contact Deformation of LiNbO3 Single Crystal:Dislocations, Twins and Ferroelectric Domains
A Study of a combined nanoindentation and AFM investigation showing that twinning and dislocation motion are two major deformation mechanisms under contact loading in periodically poled (0001) LiNbO3.

Application Note 2013-11-01

PDF PDF 752 KB
Determining Critical Stresses in Semiconductors: Using ZnO Crystal & GaN Freestanding Film
A study of the nanoindenter G200 used to perform spherical nanoindentation experiments on ZnO single crystal and GaN freestanding film.

Application Note 2013-10-30

PDF PDF 363 KB
Differentiating Surface Mechanical Properties with Dynamic Lateral Force Microscopy-Application Note

Application Note 2013-10-26

PDF PDF 467 KB
High Resolution Imaging with 7500 AFM - Application Note

Application Note 2013-10-24

PDF PDF 266 KB
Humidity-dependent AFM Nanolithography - Application Note

Application Note 2013-10-21

PDF PDF 107 KB
Mapping the Mechanical Properties of Cement-based Materials Using CSM &Ultra-fast Nanoindentation
Study of hydration mechanisms of a commercial cement paste that has been h investigated with the use of the G200 using innovative statistical ultra-fast nanoindentation.

Application Note 2013-10-15

PDF PDF 930 KB
Tribology of Dental Enamel: Effect of Etching - Application Brief
In this summary, the nano-tribological behavior of the dental enamel as a function of acid etching is characterized using a nanoindenter.

Application Note 2013-10-09

PDF PDF 214 KB
For your convenience you can now register for a FREE PDF copy of your Nanoindenter User Manual

User Manual 2013-10-09

PDF PDF
Nanotribology of Hard Thin Film Coatings: A Case Study Using the G200 Nanoindenter
Case study of the changes in elastic modulus and hardness of thin film as measured using the nanoindenter and the continuous stiffness measurement option, which measures the mechanical properties as a continuous function of depth.

Application Note 2013-09-30

PDF PDF 469 KB
In Situ Electrochemical Measurements Using the 7500 AFM - Application Note

Application Note 2013-09-27

PDF PDF 178 KB
Elastic Modulus Mapping Using the 7500 AFM - Application Note

Application Note 2013-09-24

PDF PDF 138 KB
Single Molecule Force Spectroscopy (SMFS) Using the 7500 AFM - Application Note

Application Note 2013-09-24

PDF PDF 285 KB
Vapor Annealing Effect on Copolymers Studied by 7500 AFM with Environmental Control-Application Note

Application Note 2013-09-16

PDF PDF 116 KB
The Revolutionary Impact of the Oliver and Pharr Technique on the Science of Hardness Testing
Explanation of the Oliver-Pharr method and how it can be used to obtain an equivalent Vickers hardness number

Application Note 2013-09-13

PDF PDF 120 KB
Surface Potential Measurements Using the Keysight 7500 AFM - Application Note

Application Note 2013-09-13

PDF PDF 452 KB
Current Sensing AFM Measurements Using 7500 AFM - Application Note

Application Note 2013-09-12

PDF PDF 98 KB
7500 AFM Applications in Polymer Materials - Application Note

Application Note 2013-09-12

PDF PDF 186 KB
Magnetic Force Microscopy Studies Using the Keysight 7500 AFM - Application Note

Application Note 2013-09-12

PDF PDF 287 KB
Humidity-dependent Surface Chemistry Studied by 7500 Atomic Force Microscopy - Application Note

Application Note 2013-09-12

PDF PDF 117 KB
5500 Atomic Force Microscope (AFM) - Data Sheet

Data Sheet 2013-08-30

AFM/SPM Accessories - Brochure

Brochure 2013-08-28

PDF PDF 1.17 MB
Effect of Annealing on 50nm Gold Films - Application Note
Overview of Express Test used to evaluate the effect of annealing on 50nm gold films. The note proves that vacuum annealing for three hours (sub 300°C) causes the hardness to decrease by 4.3% – 6.7% with99.9% confidence

Application Note 2013-08-20

PDF PDF 192 KB
Electromagnetic Simulations at the Nanoscale: EMPro Modeling and Comparison to SMM Experiments
In this application note, we describe electromagnetic (EM) simulations using Keysight Technologies’ EMPro software to support the interpretation of scanning microwave microscope (SMM) experiments.

Application Note 2013-07-30

PDF PDF 2.45 MB
Strain-Rate Sensitivity of Thin Metal Films by Instrumented Indentation - Application Note
A new technique for measuring strain-rate sensitivity by instrumented indentation is presented. This new technique is insensitive to thermal drift and can be used for thin films and other small volumes materials

Application Note 2013-07-30

PDF PDF 2.29 MB
In Vitro Complex Shear Modulus of Bovine Muscle Tissue - Application Note
Overview of how dynamic instrumented indentation provides a way to measure the mechanical properties of soft biological tissue

Application Note 2013-06-17

PDF PDF 1.09 MB

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