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Atomic Force Microscopes, FE-SEM, Nanoindenters, UTM

 Research Resources

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Different Contrast Mechanisms in SEM Imaging of Graphene - Application Note

Application Note 2015-02-24

PDF PDF 1.75 MB
Charging Mitigation Strategies in Imaging Insulating Polymer Spheres via Low Voltage Field Emission

Application Note 2015-02-24

PDF PDF 4.76 MB
Imaging Organic and Biological Materials with Low Voltage Scanning Electron Microscopy - App Note

Application Note 2015-02-20

PDF PDF 3.66 MB
Introduction to Scanning Microwave Microscopy - Application Note

Application Note 2015-02-12

PDF PDF 1.49 MB
High Resolution Scanning Probe Microscopy in Controlled Environments - Application Note
This Application Note reports investigations involving high resolution SPM experiments with Keysight Technologies SPMs working in a glove box environment without compromising the SPM performance.

Application Note 2015-02-02

PDF PDF 1.57 MB
Mapping the Mechanical Properties of SAC 305 Solder with Express Test - Application Note
The note discusses the use of nano-indentation to map the mechanical properties of a SAC 305 solder joint, because electronic reliability depends on mechanical integrity. Traditional nano-indentation testing time for such mapping, would have been prohibitively long but with the Express Test we were able to generate quantitative and highly resolved hardness maps in about an hour.

Application Note 2015-01-28

PDF PDF 778 KB
SMM EMPro - Application Note
In this application note, we describe electromagnetic (EM) simulations using Keysight Technologies’ EMPro software to support the interpretation of scanning microwave microscope (SMM) experiments.

Application Note 2015-01-20

PDF PDF 2.43 MB
Measuring Stress-Strain Curves for Shale Rock by Dynamic Instrumented Indentation - Application Note
Study of Dynamic instrumented indentation as an ideal way to measure the mechanical properties of shale rock. Note includes samples that can be just a few millimeters in extent, and shows that ion-milling is an adequate method of surface preparation. The note proves that test forces greater than 300mN, the primary results (reduced modulus and hardness) are accurate, repeatable, and relevant.

Application Note 2015-01-19

PDF PDF 1.17 MB
A Comparative Microscopy Imaging Study on Tissue Specimens - Application Note

Application Note 2015-01-17

PDF PDF 1.92 MB
Introduction to SECM and Combined AFM-SECM - Application Note
Introduction to Scanning electrochemical microscopy (SECM) is a powerful scanning probe technique, which is suitable for investigating surface reactivity, and processes at the solid/liquid as well as liquid/liquid interface.

Application Note 2015-01-11

PDF PDF 607 KB
Using Nanomeasurement Systems for Nanoscale Investigations of Graphene - Application Note

Application Note 2015-01-07

PDF PDF 7.95 MB
7500 Atomic Force Microscope (AFM) - Data Sheet

Data Sheet 2014-12-29

PDF PDF 4.40 MB
Mechanical Characterization of Sol Gel Coatings Using a Nano Indenter G200 - Application Note
A case study on Nanomechanical Characterization of Sol Gel Coatings.

Application Note 2014-12-29

PDF PDF 1.33 MB
Mechanical Properties Measurement on Individual Composite Micro-Fibers - Application Brief
Study of characterization of mechanical properties of bicomponent micro-fibers, consisting of nylon 6 nano-islands in a PET sea, under tensile loading.

Application Note 2014-12-29

PDF PDF 495 KB
Effect of Annealing on 50nm Gold Films - Application Note
Overview of Express Test used to evaluate the effect of annealing on 50nm gold films. The note proves that vacuum annealing for three hours (sub 300°C) causes the hardness to decrease by 4.3% – 6.7% with99.9% confidence.

Application Note 2014-12-18

PDF PDF 610 KB
Lithium/Polymer Battery Mapping-Express Test - Application Note
Investigation of the the mechanical properties of a lithium rechargeable battery cathode by using both the classic XP CSM and the new DCM Express Test method.

Application Note 2014-12-16

PDF PDF 1.90 MB
Differentiating Surface Mechanical Properties with Dynamic Lateral Force Microscopy-Application Note

Application Note 2014-12-16

PDF PDF 2.06 MB
Electrical Measurement - Application Note
Overview of electrical measurements using AFM in various modes

Application Note 2014-12-15

PDF PDF 4.11 MB
SMM Imaging of Dopant Structures of Semiconductor Devices - Application Note

Application Note 2014-12-10

PDF PDF 2.33 MB
How to choose your MAC Lever - Technical Overview

Technical Overview 2014-12-09

PDF PDF 168 KB
Attaching Antibodies to AFM Probes with Sulfhydryl Reactive PEG Tether NHS-PEG18-PDP - App Note

Application Note 2014-12-08

PDF PDF 329 KB
Attaching Antibodies to MAC Levers with the Bifunctional Amine-Amine Reactive PEG Tether - App Note

Application Note 2014-12-08

PDF PDF 742 KB
Scanning Microwave Microscope Mode - Application Note

Application Note 2014-12-04

PDF PDF 320 KB
Temperature Control - Data Sheet

Data Sheet 2014-11-17

PDF PDF 491 KB
Post Processing Pico Image Software for Keysight AFM Systems - Data Sheet
Pico Image surface imaging and analysis software is dedicated to Keysight AFMs and SPMs. It contains three levels for basic, advanced, and expert users. Standalone and network licenses are available.

Data Sheet 2014-11-13

PDF PDF 671 KB

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