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Atomic Force Microscopes, FE-SEM, Nanoindenters, UTM


 Research Resources

  • Nanoindenters Nanoindenters 


    Nanoindenter technology provides the most advanced and dependable nano- and microscale material analysis available today.

  • AFM - Atomic Force Microscopes AFM - Atomic Force Microscopes 

    AFM - Atomic Force Microscopes

    A wide range of high-precision atomic force microscopes (AFM). Keysight's atomic force microscope (AFM) products are designed to meet your research needs.

  • Scanning Electron Microscopes Scanning Electron Microscopes 

    Scanning Electron Microscopes

    The new Keysight 8500 FE-SEM is an innovative, research-grade system for imaging & characterizing materials at the nanoscale. Its compact size installs easily & delivers high resolution images and repeatable performance.

  • Universal Testing Machine (UTM) Universal Testing Machine (UTM) 

    Universal Testing Machine (UTM)

    The Keysight universal testing machine (UTM) offers researchers a superior means of nanomechanical characterization.