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Advanced Design System (ADS)

Advanced Design System is the world’s leading electronic design automation software for RF, microwave, and high speed digital applications. In a powerful and easy-to-use interface, ADS pioneers the most innovative and commercially successful technologies, such as X-parameters* and 3D EM simulators, used by leading companies in the wireless communication & networking and aerospace & defense industries. For WiMAX™, LTE, multi-gigabit per second data links, radar, & satellite applications, ADS provides full, standards-based design and verification with Wireless Libraries and circuit-system-EM co-simulation in an integrated platform. Watch our ADS 30-Second Demos to see the powerful and easy-to-use ADS interface in action.

Key Benefits of ADS

  • Complete, integrated set of fast, accurate and easy-to-use system, circuit & EM simulators enable first-pass design success in a complete desktop flow
  • Application-specific DesignGuides encapsulate years of expertise in an easy-to-use interface
  • ADS is supported exclusively or months earlier than others by leading industry and foundry partners

Learn about ADS

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Keysight EEsof EDA Newsletter - Product and Application News
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

Newsletter 2017-10-01

ADS Workspaces Download for RF and Microwave Circuit Design
ADS workspaces download, "RF and Microwave Circuit Design: A Design Approach Using (ADS)" and "100 ADS Design Examples: Based on the Textbook: RF and Microwave Circuit Design" by Ali Behagi.

Promotional Materials 2017-09-27

Keysight to Showcase Latest Measurement, Test, Design Innovations at European Microwave Week 2017
Keysight announces it will showcase a wide range of design, test and characterization solutions at European Microwave Week 2017, Booth 107, Nuremberg Convention Center Nuremberg, Oct. 10–12.

Press Materials 2017-09-19

‘The Push and Pull of Technology Solutions for 5G’ Highlights WAMICON 2017
The WAMICON 2017 Panel Session on 5G.

Article 2017-09-18

Top 10 New Signal Integrity and Power Integrity Features in ADS 2017
Advanced Design System (ADS) 2017 is coming soon and here are the top 10 new and exciting Signal Integrity (SI) and Power Integrity (PI) features. The new features aim to save engineers’ time and increase productivity.

Demo 2017-09-16

Quick Start Guide for ADS in Power Electronics
This guide shows you how to get started with ADS for high di/dt power electronics: incorporate an EM-based model of the layout parasitics from your PCB traces into the circuit simulation.

Demo 2017-08-15

Technical Experts Discuss, Demonstrate Latest EM Compatibility Techniques, SI Solutions at EMC 2017
Keysight's electromagnetic (EM) and signal (SI) and power integrity (PI) experts will be available at the 2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity (EMC 2017) to discuss a range of topics.

Press Materials 2017-08-02

Advanced Design System - Brochure
This Brochure highlights the features of Keysight EEsof EDA's Advanced Design System (ADS); the industry's premier RF, Microwave and High-Speed Design platform.

Brochure 2017-07-28

PDF PDF 2.49 MB
How to Estimate Voltage Spikes from Layout Parasitic Inductance in Switched-Mode Power Supplies
We showed you how to deal with layout parasitic inductance in our previous video entitled “How to design DC-to-DC power converters”, but a frequently asked question was “When should I start to worry about layout parasitics inductance? Is there a quick rule of thumb that says kind of ‘Caution: Further investigation’s needed?’” The answer is yes and this follow up video is about how to make these estimates.

How-To Video 2017-07-17

Time & Frequency Domain Simulation-to-Measurement Techniques by Mike Resso
This presentation discusses a step-by-step process that signal integrity engineers can follow to ensure their success in designing with USB Type-C devices.

Demo 2017-06-18

Keysight Demonstrates Latest Design, Simulation, Verification Solutions at DAC
Keysight Technologies will showcase the newest releases of its EDA software for RF-microwave circuit and system, high-speed digital, electronic system level, 3-D electromagnetic, and device-modeling applications at the 54th annual Design Automation Conference (www.dac.com), the premier conference for design and automation of electronic systems.

Press Materials 2017-06-14

Video Clips from the "Four Ways to Boost Simulation Data Processing using Python" Webcast
Watch these powerful video clips from the Keysight webcast, "Four Ways to Boost Simulation Data Processing using Python".

Demo 2017-06-12

STMicroelectronics & ESEO Use ADS To Design a 2.45 GHz Wireless Power Scavenging Circuit
Learn how STMicroelectronics and ESEO designed a 2.45 GHz wireless scavenging circuit using Advanced Design System (ADS).

Case Study 2017-06-07

PDF PDF 539 KB
Power Electronics Resources from Keysight EEsof EDA
Power Electronics Resources from Keysight EEsof EDA.

Promotional Materials 2017-06-07

Sierra Circuits Interviews Heidi Barnes at DesignCon
During DesignCon 2017, Sierra Circuits interviewed Heidi Barnes, Senior Applications Engineer at Keysight Technologies and recipient of the DesignCon Engineer of the Year Award.

Demo 2017-06-07

Electrothermal Simulation using the Wolfspeed ADS PDK
This is a short demonstration of how the Wolfspeed ADS PDK is configured to work with the ADS electrothermal simulator to co-simulate electrical and thermal performance. This allows designers to quickly understand the impact of thermal effects on their circuit designs, and account for those effects during the design process.

Demo 2017-06-02

S-parameters: Signal Integrity Analysis in the Blink of an Eye
This article discusses new concepts for serial link design and analysis as applied to physical layer test and measurement techniques. Novel test fixtures and signal integrity software tools will be discussed in real world applications in the form of design case studies.

Article 2017-05-30

Power Integrity Ecosystem by Heidi Barnes from Keysight
This Power Integrity overview provides an understanding of power integrity, why it is important, how to design for it, and it teaches techniques for high-fidelity simulation, analysis and measurement.

Demo 2017-05-29

The Melting Trace Paradox
Unlike other famous paradoxes such as the Zeno’s paradox, where Achilles and the Tortoise are involved, the melting trace paradox is one with a segment of copper trace and a current source.

Article 2017-05-24

Keysight Technologies to Present a Vision for 5G Evolution at WAMICON 2017
Keysight experts will be at WAMICON 2017, an annual IEEE Wireless and Microwave Conference, to discuss everything from circuit-level modeling to system verification for general RF, microwave, millimeter wave for 4G, emerging 5G communications, and aerospace & defense.

Press Materials 2017-04-10

How to Design for Power Integrity: DC-DC Converter Modeling and Simulation
This video describes how to create an accurate DC-DC Converter measurement based model (MBM) from just a few simple measurements.

How-To Video 2017-04-07

W1714 SystemVue AMI Modeling Kit, W1713 SystemVue SerDes Model Library
This datasheet provides an overview of the W1714 SystemVue AMI Modeling Kit, which consists of SerDes libraries for SystemVue plus automatic IBIS AMI model generation.

Data Sheet 2017-03-21

STMicroelectronics and University of Lyon Predict EMI Using ADS - Case Study
Learn how STMicroelectronics and University of Lyon designers used ADS to develop a network parameter block technique to satisfy their need for accurate and general EMI modeling.

Case Study 2017-03-17

PDF PDF 509 KB
Ensuring High Signal Quality in PCIe Gen3 Channels
This Signal Integrity Journal article written by Keysight engineer, Anil Kumar Pandey includes the challenges of maintaining transmission channel signal quality in today's PCIe Gen3 Channels.

Article 2017-03-14

Accurate Statistical-Based DDR4 Margin Estimation Using SSN Induced Jitter Model
This paper proposes a methodology, that improves the accuracy of DDR4 statistical simulation, by using the mask correction factor.

Journal 2017-03-04

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