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In-Circuit Test Systems

i1000 In-Circuit Test Systems

Cost-effective in-circuit test with digital testing capabilities added to the original low-cost NanoVTEP MUX fixture solution

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Low-Cost, Digital-Capable In-Circuit Test

Keysight Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards and a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless. i1000D ICT redefines digital testing by bringing electronics manufacturers easy to use and affordable testing for digital devices.

The i1000D supports Cover Extend Technology (CET) with a NanoVTEP MUX card. If you are already using test fixtures with NanoVTEP MUX cards , you can implement CET without any fixture modification. Simply add new NanoVTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.

Mixed signal test mode is also available on the i1000D. Execute test strategies like digital to analog and analog to digital and combine both the analog and digital test sources into a single file. This allows you to easily see both test sources at the same time.

With its unique per pin programmable capability, the i1000D provides flexibility in supporting a new pin drive test mode. You can selectively control any digital resource on the tester for disabling or preconditioning pins. In short, the pin drive test mode gives you full control of the available digital drivers on the tester, without the need for a digital test library.

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Find the Low Cost In-Circuit Tester Model That's Right for You

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U9405B

U9405B Flexicore i1000 Automated Inline Parallel ICT System

Enhanced Flexicore i1000 ICT system with parallel test features, taking advantage of multi-core processing capabilities.

U9405A

U9405A Medalist i1000D Small Foot Print Inline and Offline In-Circuit Systems

U9405A i1000D SFP is the smallest inline automated ICT in the world with the most powerful digital test capabilities. It is the only ICT platform that can be switched between inline and offline configuration.

U9401B

U9401B Medalist i1000D

The U9401B Medalist i1000D ICT system offers per pin programmable digital cards to support boundary scan, serial programming, and VCL/PCF digital testing.

U9403A

U9403A Mini In-Circuit Test System

The U9403A Mini ICT provides full ICT features like VTEP, Boundary Scan, and DUT power control which maximize your test coverage by combining functional tests.