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Enhancing Efficiency and Reliability in PCB Assembly Testing

The Keysight i3070 In-Circuit Test (ICT) System embodies proven technology, enhancing test efficiency through time-tested software, hardware, and programmability. Catering to diverse PCBA sizes, it addresses applications such as IoT, 5G, automotive, and energy. Its unique design minimizes undesired effects from parasitic capacitance, enhances immunity to crosstalk, and eliminates stray signal coupling, ensuring consistent and repeatable measurements.

Notably, the i3070 is a versatile solution available both in-line and offline, adept at meeting various needs in the production process. Whether integrated seamlessly into your assembly line or utilized in a standalone mode, the i3070 stands ready to deliver advanced in-circuit testing capabilities, ensuring the highest standards of quality and precision.

 

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News & Events

EM Innovation Award 2024

EM Innovation Award 2024

We are delighted to announce that the Keysight i3070 Series 7i has been honored with the prestigious EM Innovation Award 2024 in the 'Printed Circuit Board Assembly-Testing - ICT-Inline-Test' category during the 19th EM Innovation Awards ceremony.

This recognition is a testament to our relentless commitment to innovation and excellence in providing cutting-edge solutions that revolutionize the industry landscape.

Find the ICT Tester Model that's Right for You

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E9988GL
E9988GL In-line High-Density ICT System; Series 7i 
Starting from  
The E9988GL Keysight i3070 Series 7i Inline High-Density In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line.
E9902G
E9902G 2-Module ICT System, i317x Series 6 
Starting from  
The E9902G supports 2592 nodes, Series 6 executes Silicon Nails and Boundary-Scan up to 4x faster, while the overall physical footprint is 16% smaller than before.
E9903G
E9903G 4-Module ICT System, i307x Series 6 
Starting from  
The E9903G 4-Module In-Circuit Test (ICT) System supports up to 5184 nodes, Series 6 executes digital testing up to 4x faster while the overall physical footprint is 38% smaller.
E9905G
E9905G 2-Module In-Circuit Test (ICT) System, i327x Series 6 
Starting from  
Keysight's E9905G supports up to 2592 nodes, Series 6 executes digital testing up to 4x faster while the overall physical footprint is 38% smaller.
E9986E
E9986E In-Line Four-Module In-Circuit Test System, i367x Series 5i 
Starting from  
The E9988E Keysight Medalist i3070 Series 5i Inline In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line.
E9988E
E9988E In-Line 2-Module ICT System, i337x, Series 5i 
Starting from  
The E9988E Keysight Medalist i3070 Series 5i Inline In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line.
E9988EL
E9988EL In-Line 2-Module ICT System; i337x, Series 5i 
Starting from  
The E9988EL 2 Module In-line ICT, i3070 Series 5i, offers up to 2592 nodes testing, on a slimmer footprint. Built to stringent specifications for SMEMA compatibility.
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Develop Transformation Skills Through Our Training Programs

Browse courses and view curriculum roadmaps specific to your business needs.

H7230A-510 i3070 Boundary Scan Concepts and Applications

Learn the advanced topics for developing Boundary-Scan Test applications on the i3070 in-circuit board tester. This class covers various concepts in boundary-scan testing, such as serial programming and testing non-boundary-scan devices using boundary-scan. In addition to testing development, various debugging techniques are also detailed. The class concludes with a "best practices" section.

H7230A-516 i3070 Advanced Digital

Learn the advanced topics for developing Digital Test applications on the i3070 in-circuit board tester. This class builds upon the fundamentals of digital vector control language (VCL) and pattern capture format (PCF) that were presented in the Fundamentals classes. The attendee will learn about erase, program, and verification techniques for parallel memory, serial memory, and devices.

H7230A #500 i3070 Family Multiplexed User Fundamentals Class I

Learn the basics needed to develop a Board Test program with the i3070 Multiplexed Board Test system. Design, develop, turn-on and debug tests. Typically, Class I and II are taken consecutively.

H7230A #555 i3070 Family Multiplexed User Fundamentals Class II

Enhanced training to take the programmer beyond the basics into custom test generation. Get more performance and coverage from your i3070. Typically, Class I and II are taken consecutively.

H7230A #514 i3070 UnMuxed User Fundamentals I

In this course, test developers will learn the standard tools that are readily available on the i3070.

H7230A #515 i3070 UnMuxed User Fundamentals II

In this course, test developers learn to customize tests, generate custom test models and receive an introduction to many of the optional test tools available on the i3070.

H7230A #520 i3070 Family Production Support Training

Learn to support the 3070 on the production line - turn-on and debug tests developed by other programmers, run testhead diagnostics and interpret the results, isolate faults (testhead, fixture, test program, printed circuit board...)

H7230A #550 3070 Family Maintenance Fundamentals

Gain an understanding of the Keysight 3070 service documentation, Confirmation, and Diagnostics, System-level card operation, power, analog, digital, and control subsystem operation, and troubleshooting.

H7230A #530 i3070 In-Line Production Support Training

New production line Technicians and Engineers supporting i3070 In-Line testers on the factory floor. The participant is trained on operational requirements and best practices to set up, run, and maintain automated i3070 In-Line testers. The participant is also instructed on the basics of i3070 hardware, software to maintain production and support implementation of product ECO.

i3070 In-circuit Test Systems Featured Resources

Flyers 2024.01.16

Invest in the Future Upgrade Your i3070 Today!

Invest in the Future Upgrade Your i3070 Today!

Optimize your upgrade strategy by keeping your current pin cards and acquiring a new testhead equipped with the latest ASRU measurement cards and control cards. Unlock substantial savings of up to 60% with the purchase of the upgrade kits.

2024.01.16

Flyers 2024.01.17

Save Up to 64% on i3070 with Analog/Hybrid Pin Card Configuration

Save Up to 64% on i3070 with Analog/Hybrid Pin Card Configuration

This flyer outlines the i3070 promotion, offering savings of up to 64% on the i3070 with Analog/Hybrid Pin card configuration. Take advantage of this opportunity to invest in the i3070 bundle – an economical solution that maintains excellence in test capability, enhances testing efficiency, complies with stringent standards, and provides substantial cost savings.

2024.01.17

Flyers 2024.02.29

Unlock Up to 69% Savings with Our Pin Card Promotion

Unlock Up to 69% Savings with Our Pin Card Promotion

Upgrade now and unlock unbeatable savings on 12MPS Hybrid Pin Cards and Analog Cards with our latest promotion. Experience precision, accuracy, and repeatability with the i3070 ICT tester while maximizing the value of your upgrades through our exclusive trade-in offer.

2024.02.29

Application Notes 2023.01.04

Essential Steps for Practical Bead Probe Implementation

Essential Steps for Practical Bead Probe Implementation

This document summarizes the bead probe handbook and other relevant white papers that describe effective methods for bead probe implementation. This paper shows how to use the formula to fine-tune the parameters to achieve optimal bead heights and emphasizes the importance of considering the impact of various variables such as bead height, length, and aperture size, as well as probe force, and selecting the appropriate probe head style for different types of applications.

2023.01.04

Application Notes 2023.01.05

Practical Bead Probe Implementation Strategy

Practical Bead Probe Implementation Strategy

This application note demonstrated how you could improve the test coverage on small and complex PCBAs by adopting the bead probe handbook's strategy. This paper showcased the different experiments on the stencil aperture and fixture probe style to validate the optimum parameters.

2023.01.05

Application Notes 2022.09.23

Developing a Fixture for Extra-Large Printed Circuit Boards (PCBA)

Developing a Fixture for Extra-Large Printed Circuit Boards (PCBA)

The i3070 4-module Inline In-Circuit Tester is capable of meeting the stated board size requirements with the i3070 10.20p software version. This application note describes how to change some of the key parameters within the software to create the fixturing and test programs to accommodate a larger PCBA board requirement.

2022.09.23

Case Studies 2022.07.21

X1149 Brings Faster Testing for Server Boards

X1149 Brings Faster Testing for Server Boards

ICT (In-Circuit Testing) is well-known for its ability to provide a quick and comprehensive analysis of the PCBA's components and interconnectivity. However, ICT alone may not be sufficient because high-speed PCBA testing may necessitate a different approach. In this case study, we demonstrate how we assisted one of the world's largest original design manufacturers (ODMs) in improving the test process for their high-speed PCBA products.

2022.07.21

Application Notes 2022.07.05

Test Program Migration to 10.x software

Test Program Migration to 10.x software

How to use system variable to minimize the effort on migrating the existing test program to run on i3070 software version 10.x or latest

2022.07.05

Application Notes 2022.04.25

Fixture Reusability Consideration From In-line to Offline

Fixture Reusability Consideration From In-line to Offline

This application note describes the differences between the i3070 Series 5 inline 4 module test system (E9986E) fixture and the offline 4 module test system fixture, as well as the fixture reusability considerations.

2022.04.25

Case Studies 2022.11.10

10% Increase in ADAS PCBA Testing Throughput

10% Increase in ADAS PCBA Testing Throughput

Automotive electronics manufacturers must be prepared to address new test challenges efficiently and effectively as advanced driver assistance systems (ADAS) technology advances. This case study shows how an automotive electronics manufacturer used the Keysight in-line 4 module ICT and PathWave Manufacturing Analytics Software to cut down on labor-intensive tasks and increase test throughput.

2022.11.10

Application Notes 2021.08.04

Bypass Link Conveyor Built-in i7090 and i3070 In-Circuit Inline Tester

Bypass Link Conveyor Built-in i7090 and i3070 In-Circuit Inline Tester

The built-in bypass link conveyor in In-Circuit tester saves you the floor space and easy to setup at the manufacturing floor.

2021.08.04

Application Notes 2023.05.04

Plug and Play i3070 In-Circuit Tester into your Industry 4.0 Smart Factory using IPC-CFX

Plug and Play i3070 In-Circuit Tester into your Industry 4.0 Smart Factory using IPC-CFX

The backbone of Industry 4.0 applications is machine to machine communication. Transportation of information between machines and systems or machines to machines enables decentralized decision making. The challenge with machine-to-machine communication is that there was no standard “language”, each machine had its own communication protocols. IPC-CFX is an electronics manufacturing industry developed standard to address this challenge. IPC-CFX simplifies and standardizes machine to machine communication while also facilitating machine to business/business to machine solutions. Keysight’s i3070 In-Circuit test system supports IPC-CFX, as well as other communication protocols such as MQTT, OPC-UA and Panasonic’s iLNB.

2023.05.04

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