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L4400 Series LXI Switch and Control Instruments

The Keysight L4400 Series of switches, digital input/output and analog output instruments offer the best tradeoff in size, functionality and test. They are standalone instruments that perform the same function as their companion 34980A-Series plug-in modules. They come with a fully operational programming interface including a web-page for easy control.

For applications that require the performance of the Keysight 34980A Multifunction Switch/Measure Unit at a lower channel count.

Need help deciding which modules are right? Use our step by step guide

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Declaration of Conformity
Search Keysight Regulatory database for the most recent Declaration of Conformity statement for your product.

Help File 2014-08-01

L4400 Series LXI Compliant Instruments - User's Guide
Includes an introduction to the L4400 series product and modules, information on software installation and configuration, operating and programming, and calibration information.

User Manual 2014-08-01

PDF PDF 4.96 MB
Characterizing the I-V Curve of Solar Cells and Modules
This measurement brief explores the various test and measurement tools you can use for I-V curve characterization and provides tips to help you choose the instrument or instruments that best fit your solar cell or module measurement needs.

Application Note 2014-07-31

L4421A, 40 Channel, Armature Multiplexer - Data Sheet
This 9-page product overview of the Keysight L4421A 40-channel armature multiplexer contains product specifications as well as ordering information.

Data Sheet 2013-09-24

34980A and L44xx Memory Clearing Procedure
This document contains detailed internal memory information for the 34980A multifunction switch/measure mainframe and modules and the L44xxA series LXI switch and control instruments.

Operation Manual 2013-01-28

DOC DOC 165 KB
Bench and System Switching Products
Whether you use switching to route signals for design verification applications or for complex automated functional test systems, reliable and repeatable switching is critical for your measurement accuracy.

Brochure 2012-04-27

PDF PDF 11.37 MB
Practical Temperature Measurements (AN-290)
The purpose of this application note is to explore the more common temperature measurement techniques, and introduce procedures for improving their accuracy.

Application Note 2012-01-26

PDF PDF 1.29 MB
Efficient use of data logging and decision making w multiple scan lists
Basic data logging allows you to confi gure different measurements across multiple channels, then record the data.

Application Note 2010-04-07

PDF PDF 486 KB
Switch System Configurator
Use this configurator to define a switching solution with switches, controllers and accessories. Start by selecting if you want to use a Standard Platform, Build your Own with individual components or a Custom Solution

Selection Guide 2010-04-06

Types of Data Acquisition Architectures
To help you choose a system that meets your needs, this article explains the different types of data acquisition system architectures and explores some of the advantages and disadvantages.

Application Note 2010-02-01

Solar Cell and Module Testing
This application note describes how to decrease costs and increase flexibility for solar cell and module testing with Keysight products and solutions.

Application Note 2009-12-07

Tips for Optimizing Your Switch Matrix Performance
This application note offers eight tips to help you optimize your measurement matrix switching performance and important features to remember when designing your switching solution.

Application Note 2009-10-22

Responding to data logging events using action scripts
Combining data logging hardware and software can give you more techniques to automate extensive and repetitious measurements.

Application Note 2008-10-30

Improve your data logging productvity using advanced limit testing
Improve your data logging productvity using advanced limit testing

Application Note 2008-10-30

PDF PDF 456 KB
Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly
This note demonstrates how to use LXI instruments to create a standardized core - the open test platform (OTP), for building test systems.

Application Note 2007-02-23

Y1160A EIA Rack Sliding Shelf Installation Note
Edition 1. This installation kit contains procedures for mounting L4400 Series LXI instruments in EIA rack cabinets using the Y1160A sliding shelf rack mount kit.

Installation Manual 2006-05-01

PDF PDF 164 KB
L4400 Series Command Quick Reference
Version 1.0. Measurement commands, temperature commands, DAC configuration commands...

Reference Guide 2006-04-26

PDF PDF 103 KB
L4400 Series Programmer's Reference
This help file contains reference information to help you program Keysight L4400 Series products over the remote interface using the SCPI programming language.

Programming and Syntax Guide 2006-04-26

Optimizing Test Systems for Highest Throughput, Lowest Cost and Easy LXI Instrument Integration
A new class of LXI instruments can save rack space, money and integration time over PXI. This application note discusses the tradeoffs and also explains how to optimize execution time through careful use of SCPI to avoid LAN latency issues.

Application Note 2006-03-23

L4400 Series LXI Switching and Control Summary
This 2-page flyer features switching, digital I/O, analog outputs and counter functionality of Keysight's new L4400 Series LXI Switch/Measure products.

Promotional Materials 2006-03-15

PDF PDF 449 KB
Optimizing Test System Throughput, Cost and Integration Time Using LAN-Based Instruments
This application note explains how to minimize latency when using LAN to control your instrumentation and explains why LAN is an excellent choice for cost savings and ease of integration.

Application Note 2006-01-09

34980A Multifunction Switch/Measure Unit in Systems (8-slot mainframe)
Browse through this index of resources generated to ease your test-system design challenges.

Technical Overview 2005-11-15

Optimizing Throughput of Data Acquisition and Test Systems
Learn to speed up your test programs.

Demo 2005-08-31

LAN Connection using Telnet
When communicating with a LAN instrument using TELNET, do the following...

Application Note 2005-06-29

A Comparison of Leading Switch/Measure Solutions
This application note compares the features, execution speed and ease of software development for switch/measure solutions used in functional test and data acquisition environments.

Application Note 2005-01-27

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