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Materials Test Equipment


Materials test equipment and accessories for determining how materials interact with electromagnetic fields, by calculating permittivity and permeability. Accurate measurements of these material properties helps engineers achieve the best performance for an application, while shortening the design cycle and minimizing material scrap.

Get help with: N1500A and 8507xE Series: Service and Support

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Accessories Catalog for Impedance Measurements - Catalog
This catalog introduces all the impedance test fixtures that can be used with LCR meters, Resistance Meters, Capacitance Meters, Impedance Analyzers, and Combination analyzers. ADDITIONAL MODELS: 16196A 16196B 16196C 16197A 16064B 16190B 16380A 16380C 42030A 42090A 42091A

Selection Guide 2017-08-24

LCR Meters, Impedance Analyzers and Test Fixtures - Selection Guide
This 13-page, selection guide matchesapplications to LCR meters, Impedance analyzer, and fixtures cotains brief information on products and applicationliteratures. ADDITIONAL PRODUCTS: 4294A 42941A 4396B 4395A 4287A 4288A 4285A 4263B 4268A 4338B 4339B 4349B 4278A 4279A BIAS ADAPTER File size: 1900 KB4339B 4349B 4278A 4279A BIAS ADAPTER

Selection Guide 2017-08-14

16452A Liquid Test Fixture Operation and Service Manual
16452A Liquid Test Fixture Operation and Service Manual

User Manual 2017-08-05

N1501A Dielectric Probe Kit 10 MHz to 50 GHz - Technical Overview
Keysight's N1501A is a dielectric probe kit that is used to measure the intrinsic electrical properties of materials in the RF and microwave frequency bands.

Technical Overview 2017-07-25

Basics of Measuring the Dielectric Properties of Materials - Application Note
The dielectric properties that will be discussed here are permittivity and permeability. Resistivity is another material property which will not be discussed here.

Application Note 2017-03-07

Impedance Measurement Handbook - 6th Edition - Application Note
This 140 page handbook is Keysight Technologies's most detailed information on the basics of impedance measurements using Keysight's LCR meters and impedance analysers. It provides the theory, test set-upinformation, error discussion, etc.

Application Note 2016-11-02

Measuring Dielectric Properties Using Keysight's Materials Measurement Solutions - Brochure
Quick guide for Keysight materials measurement solutions that can characterize the material under test by measuring dielectric properties such as permittivity and permeability.

Brochure 2016-06-21

Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers
This application note presents the technologies and methods for measuring permittivity and permeability. The document focuses on impedance measurement technology with the following advantages: Wide frequency range from 20Hz to 1GHz High measurement accuracy Simple preparations (fabrication of material, measurement setup) for measurement.

Application Note 2016-06-12

Challenges and Solutions for Material Science/Engineering Testing Applications - Technical Overview
This technical overview introduces Keysight solutions for material science and engineering test applications.

Technical Overview 2016-01-28

85072A 10-GHz Split Cylinder Resonator
This technical overview provides an overview of features, measuring examples, and specification of the 85072A 10 GHz split cylinder resonator.

Technical Overview 2015-08-25

N1500A Materials Measurement Suite - Technical Overview
With Keysight N1500A materials measurement software suite, you can determine the intrinsic electromagnetic properties of many dielectric and magnetic materials.

Technical Overview 2015-06-25

85072A 10 GHz Split-Cylinder Resonator User’s and Service Guide
Provides information on making measurements, specifications, maintenance & troubleshooting, replaceable parts, and replacement procedures for the 85072A.

User Manual 2015-02-01

N1500A Web Help
Complete guide to using the N1500A Materials Measurement software

Help File 2014-12-03

Materials Measurement: Soil Materials - Application Brief
Soil materials such as rocks or clay also have electrical properties in addition to the mechanical properties as with other substances.

Application Note 2014-11-05

Materials Measurement: PCB Materials - Application Brief
This application brief provides the solutions for measuring PCB materials.

Application Note 2014-08-27

N1500A Materials Measurement Suite Installation Guide
The N1500A online Help file includes information about setup and use of the instrumentation and software

Installation Manual 2014-08-10

Materials Measurement: Liquid Materials - Application Brief
This application brief provides the solutions for measuring dielectric properties of liquid materials.

Application Note 2014-08-04

Materials Measurement: Magnetic Materials - Application Brief
This application brief provides the solutions for measuring magnetic materials.

Application Note 2014-07-17

Materials Measurement: Dielectric Materials - Application Brief
This application brief provides the solutions for measuring dielectric materials.

Application Note 2014-07-17

Magnetic Material Characterization – KEYCOM
Magnetic Material Characterization Solution from KEYCOM and Keysight.

Solution Brief 2014-04-30

mmWave Permittivity and Dielectric Loss Tangent Measurement System for sheet and ultra-thin sheet

Solution Brief 2013-05-30

Capacitance Method - εr'/tanδ measurement of Plate, Ultra Thin Film, Compound Film, Liquid and Gel
Keycom Corp.

Solution Brief 2013-05-30

Resonance Method Strip Line Type Dielectric Constant and Dielectric Loss Tangent Measurement System
Keycom Corp.

Solution Brief 2013-05-13

Network Analyzer Selection Guide (For Reference Only - Includes Discontinued Products)
This document does not contain the most up-to-date information. The document is available for reference only, for customers using legacy network analyzers. Current document:

Selection Guide 2009-02-03

Split Post Dielectric Resonators for Dielectric Measurements of Substrates - Application Note
The split post dielectric resonator (SPDR) provides an accurate technique for measuring the complex permittivity of dielectric and ferrite substrates and thin films at a single frequency point in the frequency range of 1 to 20 GHz.

Application Note 2006-07-19

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