Here’s the page we think you wanted. See search results instead:

 

Contact an Expert

Bit Error Ratio Test (BERT) Solution

Make the next leap forward with Keysight BERTs!

Keysight offers the broadest choice of BERTs - covering affordable manufacturing test and high-performance characterization and compliance testing up to 32 Gb/s

Keysight's Bit Error Ratio Test solutions allow the most accurate and efficient design verification, characterization, compliance and manufacturing test of high-speed communication ports for today's ASICs, components, modules and line-cards in the semiconductor, computer, storage and communication industry.

Keysight offers the broadest portfolio with four BERT families that address a variety of speed classes, usability concepts, and flexibility as well as application specific stimulus and analysis tools. All BERTs provide cost-effective and efficient in-depth insight into critical measurement tasks for today's and next generation devices with gigabit interfaces.

BERTs are used to test and characterize many high-speed digital interfaces:

QPI, FB-DIMM, PCI Express®, SATA,/SAS USB, Thunderbolt, DisplayPort, HDMI, MHL, MIPI, UHS-II, Fibre Channel, XAUI/10Gb Ethernet, CAUI/100GbE, CEI and other backplanes, XFI/XFP/SFP+/CFP modules, OTN, and PON-OLTs, Serdes, DAC, ADC, etc.

 

Device
under test

Bit rate Application
examples
Typical
requirements
Recommended
Keysight BERT/AWG
For R&D
Characterization, Compliance
For Manufacturing

High-speed serial
receiver in computer buses and backplanes

<16G QPI, PCI Express, SATA,
SAS, USB3, TBT, DP, SD,
UHS II, MIPI D-PHY/ M-PHY,
HDMI
 
data rates < 16 Gb/s,
calibrated jitter, SSC, ISI and S.I.,
clock recovery, pattern sequencing
J-BERT M8020A (N4903B)
M8030A * or ParBERT 81250*
n/a
<10G MIPI D-PHY/ C-PHY
HDMI, MHL
data rates < 10G, no loopback,
3-wire or multi-level
M8190A, M8195A n/a

Backplanes, Cables,
SERDES, AOC,
Repeaters

>10G -28G 10Gbase-KR4/-CR4,
CEI, IB, TBT
CAUI, CAUI 2/4
10Gbase-KR
data rates > 10 Gb/s, de-emphasis,
x-talk, PRBS
J-BERT M8020A, M8062A, N4960A, N4965A, (J-BERT N4903B/N4877A) n/a
<58G CEI-56G/112G,
400GbE
PAM-4, NRZ, PRBS M8040A n/a
Optical transceivers
and sub-components:
0.6 to 58Gb/s
<58G 400GbE, 64G FC PAM-4, NRZ, PRBS M8040A  
<28G 40G/100GbE,
32G FC,
CFP2/4
data rates > 16Gb/s
clean signals,
PRBS
N4960A, N4967A
J-BERT M8020A+M8062A
(N4903B+M8061A+N4877A)
N4960A, N4967A
10G 10G/40GbE, PON,
OTN,
8G/16G FC,
QSFP, SFP+, QFP

data rates 3 to 15Gb/s,
PRBS optical stress & sensitivity,
framed bursts

J-BERT M8020A, (N4903B+N4917A),
M8030A* or ParBERT*
N2101B,
N4906B-012,
N4962A
<4G 1GbE, XFP,
PON,
1G/2G/4G FC
data rates
< 3.5Gb/s,
fast bit synchronization, PRBS or framed bursts
N4906B-003,
ParBERT 3.3G
N5980A,
ParBERT

*for multi-lane
** up to 4 lanes

Download the Lightwave Catalog

Keysight RF and Digital Learning Center - A commitment to learning with industry experts

Refine the List

remove all refinements

By Industry/Technology

By Type of Content

By Product Category

26-50 of 156

Sort:
Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, and 2-Port TDR - Application Note
This Application Note focuses on part 1: those which use a single-port TDR, those which use TDR/TDT, and those which use 2-port TDR.

Application Note 2015-10-29

One Size Does NOT Fit All - Application Note
This application note discusses the topic of “One Size Does NOT Fit All” and how test system configurations benefit from a choice of hardware form factors and software products.

Application Note 2015-06-08

Keysight Method of Implementation (MOI) for PCIe 3.0 Tx/Rx Impedance and Return Loss Test
Keysight Method of Implementation (MOI) for PCIe 3.0 Tx/Rx Impedance and Return Loss Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2015-06-05

PDF PDF 1.43 MB
Soft Touch Connectorless Logic Analyzer Probes - Application Notes

Application Note 2015-05-20

Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P - Application Note
This document describes the requirements for forward clocking topology RX Jitter tolerance testing.

Application Note 2015-04-24

PDF PDF 2.22 MB
Keysight Method of Implementation (MOI) for 100BASE-TX Ethernet Cable Tests
Keysight Method of Implementation (MOI) for 100BASE-TX Cable Tests Using Keysight E5071C ENA Option TDR

Application Note 2015-04-07

PDF PDF 2.12 MB
Analysis of Test Coupon Structures for the Extraction of High Frequency PCB Material Properties - Wh
Exploration of the addition of Beatty series resonant impedance structures to improve the accuracy of extracting PCB material properties for the purpose of constructing 3D-EM simulations.

Application Note 2015-03-11

PDF PDF 1.73 MB
Keysight Method of Implementation (MOI) for DisplayPort 1.3 Cable-Connector Assembly Compliance Test
Keysight Method of Implementation (MOI) for DisplayPort 1.3 Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2015-02-27

PDF PDF 1.62 MB
Method of Implementation (MOI) for HEAC Cable Assembly Test
Method of Implementation (MOI) for HEAC Cable Assembly Test Using Keysight E5071C ENA Network Analyzer Option TDR.

Application Note 2014-10-20

PDF PDF 1.93 MB
Method of Implementation(MOI) for MIPI D-PHY Interface S-Parameter and Impedance Conformance Tests
Keysight Method of Implementation (MOI) for MIPI D-PHY Interface S-Parameter and Impedance Conformance Tests Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2014-10-10

PDF PDF 1.07 MB
USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the solution for the USB 2.0 test suite. The Keysight solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

Application Note 2014-08-03

An Innovative Simulation Workflow for Debugging High-Speed Digital Designs Using Jitter Separation
This paper presents a new simulation workflow for jitter separation analysis.

Application Note 2014-08-03

S-parameter Series: Transforming Oscilloscope Acquisitions for De-Embedding, Embedding & Simulating
This application note is the first in a series of s-parameter application notes and introduces us to signal acquisition and theory.

Application Note 2014-08-02

SATA II Drive TX/RX Testing & Cable SI Testing Using the 86100C DCA-J - Technical Overview
SATA II Drive Tx/Rx Testing & Cable SI Test using 86100C DCA-J. Product Note 86100-8

Application Note 2014-08-02

PDF PDF 1.94 MB
Practical Application of the InfiniiSim Waveform Transformation Toolset - Application Note
This final paper puts together the concepts and theory already presented in the preceding papers. It presents and addresses five common problems that confront engineers.

Application Note 2014-08-02

Simulating High-Speed Serial Channels with IBIS-AMI Models
This paper reviews some of the benefits and limitations of using IBIS models and introduces the new AMI extensions to the latest IBIS version 5.0 specification.

Application Note 2014-08-01

An Overview of the Electrical Validation of 10BASE-T, 100BASE-TX, and 1000BASE-T - Application Note
The technology used in these ports, commonly known as “LAN” or “NIC” ports, is usually one of the 10BASE-T, 100BASE-TX, and 1000BASE-T standards or a combination of them.

Application Note 2014-08-01

Digital Communication Analyzer (DCA), Measure Relative Intensity Noise (RIN) - Application Note
Digital Communication Analyzer (DCA), Measure Relative Intensity Noise (RIN).

Application Note 2014-07-31

Separating Read/Write Signals for DDR DRAM and Controller Validation - Application Note
To analyze the signal integrity of DDR signals, you need to differentiate the complex traffic on the data bus to independently analyze the signal performance for both DDR chip and memory controller.

Application Note 2014-07-31

PDF PDF 805 KB
Strategies for Debugging Serial Bus Systems with Infiniium Oscilloscopes – Application Note
This application note discusses the challenges associated with and new solutions for debugging serial bus designs including PCI-Express Generation 1, Inter Integrated Circuit (I2C), Serial Peripheral Interface (SPI), or Universal Serial Bus (USB)

Application Note 2014-07-31

Properly Powering On & Off Multiple Power Inputs in Embedded Designs - Application Note
This is the first in a series of application notes that addresses power optimization, characterization and simulation challenges in embedded designs.

Application Note 2014-07-31

USB Design and Test - A Better Way - Application Note
Brochure covering Keysight's USB 2.0 and 3.0 test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.

Application Note 2014-07-31

Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect Tests
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect Tests Using Keysight E5071C ENA Option TDR

Application Note 2014-04-21

PDF PDF 1.71 MB
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Tx/Rx Return Loss Tests
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Tx/Rx Return Loss Tests Using Keysight E5071C ENA Option TDR

Application Note 2014-04-21

PDF PDF 1.03 MB
Method of Implementation(MOI) for MIPI M-PHY Interface S-Parameter and Impedance Conformance Tests
Keysight Method of Implementation (MOI) for MIPI M-PHY Interface S-Parameter and Impedance Conformance Tests Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2014-03-20

PDF PDF 978 KB

Previous 1 2 3 4 5 6 7 Next