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Parameter & Device Analyzer, Curve Tracer

The Keysight Device Analyzer Series provides both traditional and task-oriented approaches to device characterization to meet the complex challenges faced by modern users. Able to completely replace our older 4145, 4155 and 4156 parameter analyzers, the B1500A has additional hardware and software features that enable both novice and advanced users to efficiently and effectively characterize advanced semiconductor processes and devices. For high-power device testing needs, the B1505A provides a one-box solution for high-current, high-voltage and high DC bias capacitance measurement.

In addition, both the B1500A and B1505A support a curve tracer mode with true knob sweep control for real-time interactive device measurement.

  • Low-leakage Switch Matrix Mainframes (B2200A/B2201A/E5250A) Low-leakage Switch Matrix Mainframes (B2200A/B2201A/E5250A) 

    Low-leakage Switch Matrix Mainframes (B2200A/B2201A/E5250A)

    Low-leakage switch mainframe solutions, positioned between the semiconductor parameter analyzer and the wafer, reduce cost of test through characterization test automation (B2200A, B2201A and E5250A).

  • Power Device Analyzers Power Device Analyzers 

    Power Device Analyzers

    • Best solutions for power device evaluation
    • Wide range voltage and current ratings
    • Both IV and CV test capabilities
    • Intuitive and automated operation

Discontinued and Obsolete Parametric Test Equipment [Discontinued]
4155C, 4156C, 41000 Series, N9201A, 4070 Series, 4140B, 4142B, 4145A/B, 4155A, 4156A, 41501A, 4155B, 4156B, 4157A, 4157B,4280A, E5270A, E5272A, and E5273A

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