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Parametric Test

Integrated circuit devices continue to shrink in size, increase in density, and improve in performance every year. Manufacturing and testing these devices while simultaneously maintaining and improving yield has become increasingly difficult. Nevertheless, Keysight Technologies' parametric test solutions continue to meet these challenges and to provide users with consistently accurate and highly automated test solutions for better process monitoring. Our award winning parametric test systems are a de facto industry standard, with over 4,000 systems installed worldwide. With a history of over 70 years of innovation and leadership in the Test and Measurement industry, Keysight knows what it takes to meet the stringent demands of parametric test customers.

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The parametric Measurement Handbook
This handbook describes how to evaluate accurate current, voltage, or capacitance measurement by explaining parametric measurement basic

Brochure 2014-01-22

Are You Ready to Migrate to the Platform that Solves Your Toughest Test Challenges?
The 4080 overcomes advanced measurement challenges with faster system architecture, synchronous and asynchronous parallel test capabilities, high-voltage semiconductor pulse generator units, automated RF calibration, and an optional 20 GHz RF matrix.

Brochure 2008-08-27