Sprechen Sie mit einem Experten

Software

Laden Sie Ihre nächste Erkenntnis herunter 

Als Entwickler stehen Sie oft vor der Herausforderung, aus einer Vielzahl von Alternativen die jeweils beste auszuwählen. Das geht schneller, wenn Sie mit wenigen Klicks einen tiefen Einblick in Ihr Design erhalten. Genau dafür haben wir Keysight Software entwickelt – laden Sie Ihre nächste Erkenntnis einfach herunter. Für alle Phasen des Produktzyklus – vom Schaltungs-entwurf/Simulation bis zur Auslieferung des Serienprodukts – liefern wir die Tools, die Ihr Team benötigt, um schnellstmöglich Daten in Information zu verwandeln und daraus Erkenntnisse zu gewinnen. Unsere bewährten High-End-Softwarelösungen wie ADS und VSA helfen Ihnen, sich an vorderster Front des tech-nischen Fortschritts zu positionieren. Laden Sie Ihre nächste Erkenntnis einfach von unserer Website herunter. 

  •  Die branchenführende EDA- (Electronic Design Automation) Software beschleunigt die Entwicklung von HF-, Mikrowellen- und Hochgeschwindigkeitsdigitalschaltungen
  • Eingebettete und autonome Software-Applikationen ermög-lichen einen tieferen Einblick in Messungen und Analysen 
  • Leistungsfähige Utilities sparen Zeit und erleichtern Ihnen die Arbeit – schließen Sie einfach Ihre Messgeräte an und legen Sie mit der Programmierung los
  • Die Programmierumgebungen unterstützen grafische Program-mierung, Sequenzierung, Analyse...

 

Überzeugen Sie sich selbst – laden Sie kostenlose Testversionen herunter!

  • Halten Sie Schritt mit den neuesten Standards und Entwick-lungen
  • Lernen Sie unser vielfältiges Angebot an Applikationen kennen
  • Reduzieren Sie Ihr Risiko, indem Sie die Software vor dem Kauf kostenlos testen   

 

Zur Ansicht dieses Textes, benötigen Sie einen Browser der JavaScript und Adobe Flash Player kompatibel ist

Flash herunterladen 

Refine the List

Alle detailierte Suchkriterien entfernen

By Industry/Technology

By Type of Content

Nach Produkt Kategorie

1-25 of 467

Sort:
Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief
This “DOCSIS 3.1 Test Solution" app brief gives insight into Keysight solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

Application Note 2015-08-14

Power Supply Rejection Ratio (PSRR) Measurements - Application Note
Power Supply Rejection Ratio (PSRR) measurements for power supply characterization, unique to Keysight’s portfolio of measurements, can be performed using InfiniiVision X-Series oscilloscopes.

Application Note 2015-08-13

Power Supply Control Loop Response (Bode Plot) Measurements - Application Note
Unique to Keysight’s portfolio of measurements are frequency response measurements including Control Loop Response (Bode) and can be performed using InfiniiVision X-Series oscilloscopes.

Application Note 2015-08-13

Oscilloscope Measurement Tools to Help Debug Automotive Serial Buses Faster - Application Note
Keysight's InfiniiVision Series oscilloscopes offer some unique measurement capabilities for debugging and characterizing the physical layer of automotive serial buses.

Application Note 2015-08-01

W-CDMA Dynamic Power Analysis Using the 8960 - Application Note
This document illustrates how to use the dynamic power analysis measurement in the Keysight 8960 test set to measure user equipment (UE) power sequences.

Application Note 2015-07-31

PDF PDF 379 KB
How to Take Fast, Simultaneous Measurements of Two or More Signals using BenchVue Software
Keysight BenchVue software for the PC accelerates your testing by providing multiple instrument measurement visibility and data capture with no programming necessary.

Application Note 2015-07-30

PDF PDF 1.15 MB
Making EMI Compliance Measurements - Application Note
This application note provides an overview of EMI compliance test requirements and measurement approaches.

Application Note 2015-07-25

Optimizing RF and Microwave Spectrum Analyzer Dynamic Range -- Application Note
The dynamic range of a spectrum analyzer is traditionally defined as the ratio, in dB, of the largest to the smallest signals simultaneously present at the input of the spectrum analyzer that allows measurement of the smaller to a given degree of uncertainty. The signals of interest can either be...

Application Note 2015-07-24

Optimizing RF and Microwave Spectrum Analyzer Dynamic Range - Application Note
This application note defines the elements of spectrum analyzer measurement speed and shows how to choose solution bandwidth and data output format for fast measurements.

Application Note 2015-07-22

Dynamic Power Measurements for cdma2000 on the Keysight 8960 Wireless Test Set - Application Note
Power control is essential in CDMA devices. This application note explains how the use of dynamic power measurement can help ensure the in-field performance of CDMA wireless devices.

Application Note 2015-07-15

New Pulse Analysis Techniques for Radar and EW - Application Note
This app note discusses the best tools for different types of pulse analysis, along with display and analysis techniques for various signals and measurement goals.

Application Note 2015-07-12

PDF PDF 2.86 MB
Keysight Method of Implementation (MOI) for PCIe 3.0 Tx/Rx Impedance and Return Loss Test
Keysight Method of Implementation (MOI) for PCIe 3.0 Tx/Rx Impedance and Return Loss Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2015-06-05

PDF PDF 1.43 MB
Noise Figure Uncertainty Calculator
The noise figure uncertainty calculator has been created to aid your design work, from components through to systems, helping you meet the continued demand for higher system performance.

Analysis Tool 2015-05-29

Understanding the Fundamental Principles of Vector Network Analysis - Application Note 1287-1
This application note explores the fundamental principles of vector network analysis. The discussion includes the common parameters (S-parameters). RF fundamentals such as transmission lines and the Smith chart will also be reviewed.

Application Note 2015-05-15

Drive Down the Cost of Test Using the ENA Series of Network Analyzers - Application Note
In this application note, we discuss the contributions of Keysight Technologies, Inc.’s ENA Series of Vector Network Analyzers (ENA, hereafter) to drive down the cost of test in production lines.

Application Note 2015-05-01

PDF PDF 2.46 MB
Basics of Measuring the Dielectric Properties of Materials - Application Note
The dielectric properties that will be discussed here are permittivity and permeability. Resistivity is another material property which will not be discussed here.

Application Note 2015-04-27

A Flexible Test Solution for 2.4 GHz ZigBee Transmitter and Receivers - Application Note
This application note explains a low cost measurement solution for 2.4 GHz ZigBee O-QPSK signal generation for receiver test and signal analysis for transmitter test

Application Note 2015-04-17

Radar Development Using Model-Based Engineering
This application note describes how SystemVue is well suited for use in model-based engineering. It is for system engineers, directors of engineering and people involved in the development of Radar.

Application Note 2015-04-14

PDF PDF 1.59 MB
Keysight Method of Implementation (MOI) for 100BASE-TX Ethernet Cable Tests
Keysight Method of Implementation (MOI) for 100BASE-TX Cable Tests Using Keysight E5071C ENA Option TDR

Application Note 2015-04-07

PDF PDF 2.12 MB
100 Gb/s Ethernet 100GBASE-CR4 Test Points and Test Fixtures - Application Note
This application note provides a detailed technical overview of 100GBASE-CR4 test point specifications and test fixtures to implement testing of physical media signals at the MDI and cable assemblies.

Application Note 2015-04-01

PDF PDF 1.71 MB
Testing New-Generation WLAN 802.11ac - Application Note
This application note introduces the new WLAN new-generation testing technology of 802.11ac and the many different Keysight solutions for testing WLAN 802.11ac.

Application Note 2015-04-01

Using Microprobing, Modeling and Error Correction to Optimize Channel Design - Application Note
This application note will discuss step-by-step channel analysis methodologies using microprobing measurements with simulation and modeling tools to show accurate results to 20 GHz.

Application Note 2015-03-27

PDF PDF 1.08 MB
Characterization of PCB Insertion Loss with a New Calibration Method - Application Note
In this application note a new method for characterizing PCB loss by using AFR with 1X Open fixtures is proposed.

Application Note 2015-03-26

PDF PDF 700 KB
Achieving Higher Measurement Accuracy & Better Correlation for PCB Impedance Test - Application Note
Traditional method for PCB impedance measurements is difficult to meet accuracy required today. Measurement with full calibration is introduced to meet accuracy for the latest PCB impedance test.

Application Note 2015-03-24

Performing LTE & LTE-Advanced RF Measurements with E7515A UXM Wireless Test Set - Application Note
This application note provides insights into example test procedures for RF testing of LTE and LTE-A UEs based on 3GPP TS 36.521-1 V12.2.0 (2014-06).

Application Note 2015-03-24

PDF PDF 9.75 MB

1 2 3 4 5 6 7 8 9 10 ... Next